Period | 22 Sep 2017 |
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Event title | 13th International Symposium on Measurement Technology and Intelligent Instruments |
Event type | Conference |
Conference number | 13 |
Location | Xi'an, China |
Degree of Recognition | International |
A method for inspecting double-sided high-sloped structured surfaces based on dual-probe wavelength scanning interferometer
Activity: Talk or presentation types › Oral presentation