A systematic approach to metrology for additive manufactured components for advanced industrial applications

Andrew Townsend (Speaker), Lou, S. (Contributor to Paper or Presentation), Racasan, R. (Contributor to Paper or Presentation), Bills, P. (Invited speaker)

Activity: Talk or presentation typesInvited talk

Period10 Apr 201912 Apr 2019
Event titleInternational Conference on Industrial Dimensional Metrology: Metromeet 2019
Event typeConference
LocationBilbao, Spain
Degree of RecognitionInternational