A systematic approach to metrology for additive manufactured components for advanced industrial applications

  • Andrew Townsend (Speaker)
  • Lou, S. (Contributor to Paper or Presentation)
  • Racasan, R. (Contributor to Paper or Presentation)
  • Bills, P. (Invited speaker)

Activity: Talk or presentation typesInvited talk

Period10 Apr 201912 Apr 2019
Event titleInternational Conference on Industrial Dimensional Metrology: Metromeet 2019
Event typeConference
LocationBilbao, Spain
Degree of RecognitionInternational