A systematic approach to metrology for additive manufactured components for advanced industrial applications

Townsend, A. (Speaker), Lou, S. (Contributor to Paper or Presentation), Racasan, R. (Contributor to Paper or Presentation), Bills, P. (Invited speaker)

Activity: Talk or presentation typesInvited talk

Period10 Apr 2019 - 12 Apr 2019
Held atInternational Conference on Industrial Dimensional Metrology
Event typeConference
LocationBilbao, Spain
Degree of RecognitionInternational