Development of virtual reference samples for XCT measurements of additively manufactured surface texture

Xiao Chen (Speaker), Qiushuang Zhang (Speaker), Wenjuan Sun (Speaker), Zeng, W. (Speaker), Xin Jin (Speaker), Scott, P. (Speaker), Jiang, J. (Speaker), Lou, S. (Speaker)

Activity: Talk or presentation typesOral presentation

Description

This paper proposes a method to produce virtual reference samples for X-ray computed tomography (XCT) measurements of additively manufactured (AM) surface texture using simulation approach. The virtual reference samples combine ideal CAD geometry with measured AM surface texture based on Boundary representation (B-rep) method. The surface texture is measured from real Electron Beam Melting (EBM) components using the optical focus variation microscope and described into mathematical models by Non-uniform rational B-spline (NURBS) method for the integration. The XCT simulation based on the developed virtual reference samples allows the investigation of the impact of different factors (e.g. voxel size) on XCT measurements of AM surface texture
Period5 Feb 2020
Event title10th Conference on Industrial Computed Tomography
Event typeConference
Conference number10
LocationWels, Austria
Degree of RecognitionInternational