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Embedded Metrology for Surface Measurement and Inspection
Gao, F.
(Speaker)
Department of Engineering and Technology
School of Computing and Engineering
Activity
:
Talk or presentation types
›
Invited talk
Period
10 May 2018
Event title
Sixth International Conference on Optical and Photonic Engineering
Event type
Conference
Location
Shanghai, China
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Degree of Recognition
International
Documents & Links
Link to Conference Website