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Examining the effect of the depth profile on the electrical properties of transition metal oxide thin films
Rossall, A.
(Speaker)
Department of Engineering and Technology
School of Computing and Engineering
Activity
:
Talk or presentation types
›
Oral presentation
Period
26 Jun 2018
Held at
9th International Workshop on High-Resolution Depth Profiling
Event type
Conference
Location
Uppsala, Sweden
Degree of Recognition
International