Exploitation of Industrial X-ray Computed Tomography for Surface Metrology of Metallic Additively Manufactured Parts
- Lou, S. (Speaker)
- Zeng, W. (Contributor to Paper or Presentation)
- Wenjuan Sun (Contributor to Paper or Presentation)
- Chen, X. (Contributor to Paper or Presentation)
- Weidong Liu (Contributor to Paper or Presentation)
- Scott, P. (Contributor to Paper or Presentation)
- Jiang, J. (Contributor to Paper or Presentation)
Activity: Talk or presentation types › Invited talk