In-Situ Surface Inspection Using White Light Channelled Spectrum Interferometer

Tang, D. (Speaker), Jiang, J. (Speaker), Gao, F. (Speaker)

Activity: Talk or presentation typesOral presentation

Period2 Mar 2015
Held at15th International Conference on Metrology and Properties of Engineering Surfaces
Event typeConference
Conference number15
LocationCharlotte, United States, North Carolina
Degree of RecognitionInternational