The development of computational FE system and its application to low Cr alloy weld

  • Feng Tan (Speaker)
  • Xu, Q. (Speaker)
  • Lu, J. (Contributor to Paper or Presentation)
  • Barrans, S. (Contributor to Paper or Presentation)
  • Ian Glover (Contributor to Paper or Presentation)

Activity: Talk or presentation typesPoster presentation

Period4 Dec 2013
Event title6th International High-temperature Defect Assessment (HIDA) Conference: Life/Defect Assessment & Failures in High Temperature Plant
Event typeConference
Conference number6
LocationNagasaki, JapanShow on map
Degree of RecognitionInternational