The development of computational FE system and its application to low Cr alloy weld

Feng Tan (Speaker), Xu, Q. (Speaker), Lu, J. (Contributor to Paper or Presentation), Barrans, S. (Contributor to Paper or Presentation), Ian Glover (Contributor to Paper or Presentation)

Activity: Talk or presentation typesPoster presentation

Period4 Dec 2013
Event title6th International High-temperature Defect Assessment (HIDA) Conference: Life/Defect Assessment & Failures in High Temperature Plant
Event typeConference
Conference number6
LocationNagasaki, Japan
Degree of RecognitionInternational