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8 Last checked 8 March 2022


Dr Martin is a Senior Lecturer in the School of Computing and Engineering since 2014. This academic appointment followed on from a previous appointments as Senior Research Fellow (2012) and Research Fellow (2010) at the University of Huddersfield. For research purposes he is located of the EPSRC Centre for Innovative Manufacturing in Advanced Metrology (CIMAM) which is part of the Centre for Precision Technologies (CPT).
Dr Martin has expertise in the fields of applied optics, electronics, embedded systems and metrology. 

His research concentrates on the development of novel optical sensing methods for producing high accuracy, stable, robust surface and dimensional metrology instrumentation suitable for embedding on high/ultra-precision manufacturing platforms. The aim is to move metrology away from expensive, heavy standalone off-line instrumentation without sacrificing performance and helping enable the future move to flexible and distributed manufacturing.

Embedded metrology, where measurement taken on the manufacturing platform can alleviate many difficulties associated with process control and workpiece evaluation. The result is increased production rates, a reduction in the requirement for skilled operators, and an enhanced ability to automate. For manufacturing in the medium term embedded surface/dimensional measurement is a key piece in the puzzle needed to provide: a) mass production of next-generation engineered products featuring complex geometries and features; b) improved flexibility and automation for future factories and customised products; c) improvement on the state-of-the-art for manufacturing supporting cutting edge science.

His research involves the development of novel optical measurement principles based primarily on interferometry. This involves the creation of instrumentation using a range of light source types, bulk optics, integrated-optics, acousto-optics, optical fibre. The development of hardware-optimised signal processing schemes is also an essential activity as part of this work.

Research Degree Supervision

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Research Expertise and Interests

  • Optical Metrology
  • Optics
  • Electronics
  • Applied Optics
  • Surface Metrology
  • Interferometry


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