Personal profile

Biography

Dr Hussam Muhamedsalih is a research fellow in the EPSRC Centre for Innovative Manufacturing in Advanced Metrology (CIMAM) at the University of Huddersfield.

Hussam initially joined the University of Huddersfield to study for an MSc in Control Systems and Instrumentation, graduating in February 2008. Continuing his studies at Huddersfield, Hussam was awarded a PhD by the University of Huddersfield on 8th May 2013 for the project ‘Investigation of wavelength scanning interferometry for embedded metrology’, supervised by Prof. Xiangqian Jiang. On the 9th May 2013, he was appointed as a full-time position as research fellow at the CIMAM.

Hussam published more than 7 papers in international conference proceedings and prestigious journals such as 'Applied Optics', 'Optics Letter' and 'Proceedings of SPIE'. He is also co-inventor of one international patent (WO/2010/082066: Surface Characteristic Determining Apparatus). Currently, Dr Muhamedsalih is working under the FP7 project ‘NanoMend’, to develop novel technologies for the in-line detection of nano-scale defects for thin film barrier coatings on large area substrates.

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  • 6 Similar Profiles
Interferometry Engineering & Materials Science
interferometry Physics & Astronomy
Scanning Engineering & Materials Science
Wavelength Engineering & Materials Science
scanning Physics & Astronomy
defects Physics & Astronomy
wavelengths Physics & Astronomy
Atomic layer deposition Engineering & Materials Science

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Research Output 2013 2018

  • 10 Conference contribution
  • 4 Article
Open Access
Interferometry
interferometry
Scanning
filters
Wavelength
Open Access
Interferometry
interferometry
Scanning
Wavelength
scanning

A computerised data handling procedure for defect detection and analysis for large area substrates manufactured by roll-to-roll process

Muhamedsalih, H., Elrawemi, M., Blunt, L., Lan, X. & Martin, H. 2015 Laser Metrology and Machine Performance XI - 11th International Conference and Exhibition on Laser Metrology, Machine Tool, CMM and Robotic Performance, LAMDAMAP 2015. euspen, p. 82-89 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

files
defects
atomic layer epitaxy
field of view
water vapor

An integrated opto-mechanical measurement system for in-process defect measurement on a roll-to-roll process

Muhamedsalih, H., Blunt, L., Martin, H., Hamersma, I., Elrawemi, M. & Gao, F. 2015 Laser Metrology and Machine Performance XI - 11th International Conference and Exhibition on Laser Metrology, Machine Tool, CMM and Robotic Performance, LAMDAMAP 2015. euspen, p. 97-105 9 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

mechanical measurement
foils
defects
inspection
vapors

Extending the vertical range of wavelength scanning interferometry

Moschetti, G., Muhamedsalih, H., Jiang, X., Leach, R. K. & O'Connor, D. 2015 Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology. American Society for Precision Engineering, ASPE, p. 50-55 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution