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Personal profile

Biography

Dr Hussam Muhamedsalih is a research fellow in the EPSRC Centre for Innovative Manufacturing in Advanced Metrology (CIMAM) at the University of Huddersfield.

Hussam initially joined the University of Huddersfield to study for an MSc in Control Systems and Instrumentation, graduating in February 2008. Continuing his studies at Huddersfield, Hussam was awarded a PhD by the University of Huddersfield on 8th May 2013 for the project ‘Investigation of wavelength scanning interferometry for embedded metrology’, supervised by Prof. Xiangqian Jiang. On the 9th May 2013, he was appointed as a full-time position as research fellow at the CIMAM.

Hussam published more than 7 papers in international conference proceedings and prestigious journals such as 'Applied Optics', 'Optics Letter' and 'Proceedings of SPIE'. He is also co-inventor of one international patent (WO/2010/082066: Surface Characteristic Determining Apparatus). Currently, Dr Muhamedsalih is working under the FP7 project ‘NanoMend’, to develop novel technologies for the in-line detection of nano-scale defects for thin film barrier coatings on large area substrates.

Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

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Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 2010 2018

  • 13 Conference contribution
  • 7 Article
  • 1 Conference article

An investigation of a single shot dual wavelength polarised interferometer which uses Carre and Four Step Phase Shift Algorithms

Al-Bashir, S., Muhamedsalih, H., Gao, F. & Jiang, X., 5 Jun 2018, Proceedings of EUSPEN 18th International Conference & Exhibition, Venice, IT, June 2018. euspen, p. 113-114 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Open Access
File
shot
phase shift
interferometers
wavelengths
ambiguity
Open Access
Interferometry
interferometry
Scanning
filters
Wavelength

Single Shot Dual Wavelength Polarised Interferometer

Muhamedsalih, H., Al-Bashir, S., Gao, F. & Jiang, X., 6 Feb 2018, (Accepted/In press) 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC). IEEE, p. 353-358 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Open Access
File
shot
interferometers
wavelengths
ambiguity
phase shift
1 Citations
Open Access
Interferometry
interferometry
Scanning
Wavelength
scanning

A computerised data handling procedure for defect detection and analysis for large area substrates manufactured by roll-to-roll process

Muhamedsalih, H., Elrawemi, M., Blunt, L., Lan, X. & Martin, H., 2015, Laser Metrology and Machine Performance XI - 11th International Conference and Exhibition on Laser Metrology, Machine Tool, CMM and Robotic Performance, LAMDAMAP 2015. euspen, p. 82-89 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

files
defects
atomic layer epitaxy
field of view
water vapor

Activities 2014 2014

  • 1 Oral presentation

A Flexible PV Barrier Films Defects Detection System for In-Situ R2R Film Processing

Feng Gao (Speaker), Hussam Muhamedsalih (Speaker), Liam Blunt (Speaker), Jane Jiang (Speaker), Mohamed Elrawemi (Speaker), S. Edge (Speaker), P. Hollis (Speaker), David Bird (Speaker)
19 Nov 2014

Activity: Talk or presentation typesOral presentation