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Research Output 2010 2020

  • 14 Conference contribution
  • 8 Article
  • 2 Conference article
2020
optical measurement
retarding
filters
Surface topography
Interferometers
2019

Fabrication and characterisation of metal-doped pectin films

Kalathaki, I., Alba, J., Muhamedsalih, H. & Kontogiorgos, V., 1 Jul 2019, In : Food Hydrocolloids. 92, p. 259-266 8 p.

Research output: Contribution to journalArticle

Open Access
File
films (materials)
pectins
Metals
metals
Fabrication
2018

An investigation of a single shot dual wavelength polarised interferometer which uses Carre and Four Step Phase Shift Algorithms

Al-Bashir, S., Muhamedsalih, H., Gao, F. & Jiang, X., 5 Jun 2018, European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 18th International Conference and Exhibition, EUSPEN 2018. Riemer, O., Savio, E., Billington, D., Leach, R. K. & Phillips, D. (eds.). euspen, p. 113-114 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Open Access
File
Phase shift
Interferometers
shot
phase shift
interferometers
2 Citations (Scopus)
Open Access
Interferometry
interferometry
Scanning
filters
Wavelength
2 Citations (Scopus)

Single-Shot RGB Polarising Interferometer

Muhamedsalih, H., Al-Bashir, S., Gao, F. & Jiang, X., 18 Aug 2018, Interferometry XIX: Proceedings of SPIE. Creath, K., Burke, J., Davies, A. D., North Morris, M. B. & Creath, K. (eds.). SPIE, Vol. 10749. 6 p. 1074909

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Interferometer
Interferometers
shot
interferometers
Wavelength
2016
1 Citation (Scopus)
Open Access
Interferometry
interferometry
Scanning
Wavelength
scanning
2015

A computerised data handling procedure for defect detection and analysis for large area substrates manufactured by roll-to-roll process

Muhamedsalih, H., Elrawemi, M., Blunt, L., Lan, X. & Martin, H., 2015, Laser Metrology and Machine Performance XI - 11th International Conference and Exhibition on Laser Metrology, Machine Tool, CMM and Robotic Performance, LAMDAMAP 2015. euspen, p. 82-89 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

files
defects
atomic layer epitaxy
field of view
water vapor
3 Citations (Scopus)

An integrated opto-mechanical measurement system for in-process defect measurement on a roll-to-roll process

Muhamedsalih, H., Blunt, L., Martin, H., Hamersma, I., Elrawemi, M. & Gao, F., 2015, Laser Metrology and Machine Performance XI - 11th International Conference and Exhibition on Laser Metrology, Machine Tool, CMM and Robotic Performance, LAMDAMAP 2015. euspen, p. 97-105 9 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

mechanical measurement
foils
defects
inspection
vapors

Extending the vertical range of wavelength scanning interferometry

Moschetti, G., Muhamedsalih, H., Jiang, X., Leach, R. K. & O'Connor, D., 2015, Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology. American Society for Precision Engineering, ASPE, p. 50-55 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Implementation of in process surface metrology for R2R flexible PV barrier films

Elrawemi, M., Blunt, L., Muhamedsalih, H., Gao, F. & Fleming, L., 2015, In : International Journal of Automation Technology. 9, 3, p. 312-321 10 p.

Research output: Contribution to journalArticle

Open Access
Atomic layer deposition
Defects
Surface defects
Water vapor
Inspection

Implementation of wavelength scanning interferometry for R2R flexible PV barrier films

Blunt, L., Muhamedsalih, H., Elrawemi, M., Martin, H., Hamersma, I., Gao, F. & Jiang, X., 2015, Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015. euspen, p. 199-200 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

barrier layers
Interferometry
interferometry
Interferometers
Scanning

In-situ defect detection systems for R2R flexible PV barrier films

Gao, F., Muhamedsalih, H., Tang, D., Elrawemi, M., Blunt, L., Jiang, X., Edge, S., Bird, D. & Hollis, P., 5 Aug 2015, In : Proceedings of SPIE - The International Society for Optical Engineering. 9622, 96220E.

Research output: Contribution to journalConference article

Defect Detection
defects
Interferometry
Defects
interferometry

In-situ defect detection systems for R2R flexible PV barrier films

Gao, F., Muhamedsalih, H., Tang, D., Elrawemi, M., Blunt, L., Jiang, X., Edge, S., Bird, D. & Hollis, P., 2015, Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology. American Society for Precision Engineering, ASPE, p. 44-49 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Vertical axis non-linearities in wavelength scanning interferometry

Moschetti, G., Muhamedsalih, H., O'Connor, D., Jiang, X. & Leach, R. K., 2015, Laser Metrology and Machine Performance XI - 11th International Conference and Exhibition on Laser Metrology, Machine Tool, CMM and Robotic Performance, LAMDAMAP 2015. euspen, p. 31-39 9 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

interferometry
nonlinearity
scanning
wavelengths
exclusion
2014
2 Citations (Scopus)

An interferometric auto-focusing method for on-line defect assessment on a roll-to-roll process using wavelength scanning interferometry

Muhamedsalih, H., Blunt, L., Martin, H., Jiang, X. & Elrawemi, M., 2014, Conference Proceedings - 14th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2014. euspen, Vol. 1. p. 177-180 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Atomic layer deposition
barrier layers
atomic layer epitaxy
Interferometry
interferometry

Development of the basis for in process metrology for roll to roll production of flexible photo voltaics

Blunt, L., Elrawemi, M., Fleming, L., Martin, H., Muhamedsalih, H. & Robbins, D., 2014, 11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry, LMPMI 2014. IMEKO-International Measurement Federation Secretariat, p. 9-12 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Polymer films
Defects
Atomic layer deposition
Defect density
Gallium

In-line metrology for defect assessment on large area Roll 2 Roll substrates

Blunt, L., Fleming, L., Elrawemi, M., Robbins, D. & Muhamedsalih, H., Sep 2014, 11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry (LMPMI 2014). International Measurement Confederation (IMEKO), p. 1-6 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Open Access
metrology
defects
water vapor
modules
research projects
2013
7 Citations (Scopus)
Open Access
Surface measurement
Interferometers
Scanning
Wavelength
Parallel programming
7 Citations (Scopus)

In-Line Metrology of Functional Surfaces with a Focus on Defect Assessment on Large Area Roll to Roll Substrates

Blunt, L., Flemin, L., Elrawemi, M., Robbins, D. & Muhamedsalih, H., Jan 2013, Proceedings of the 13th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2013. euspen, Vol. 1. p. 71-74 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

metrology
Defects
defects
Substrates
Indium

In-process fast surface measurement using wavelength scanning interferometry

Gao, F., Muhamedsalih, H. & Jiang, X., 2013, Manufacturing Science and Technology III. Vol. 622. p. 357-360 4 p. (Advanced Materials Research; vol. 622).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Surface measurement
Interferometry
Scanning
Wavelength
Phase shift
2012
18 Citations (Scopus)

Comparison Study of Algorithms and Accuracy in the Wavelength Scanning Interferometry

Jiang, X., Muhamedsalih, H. & Gao, F., 20 Dec 2012, In : Applied Optics. 51, 36, p. 8854-8862 9 p.

Research output: Contribution to journalArticle

Interferometry
interferometry
Scanning
Wavelength
scanning
24 Citations (Scopus)

Surface and Thickness Measurement of a Transparent Film Using Wavelength Scanning Interferometry

Jiang, X., Gao, F. & Muhamedsalih, H., 10 Sep 2012, In : Optics Express. 20, 19, p. 21450-21456 7 p.

Research output: Contribution to journalArticle

Open Access
interferometry
scanning
wavelengths
signal reflection
interferometers
2011
7 Citations (Scopus)

Comparison of Fast Fourier Transform and Convolution in Wavelength Scanning Interferometry

Muhamedsalih, H., Jiang, X. & Gao, F., 26 May 2011, Optical Measurement Systems for Industrial Inspection VII. Lehmann, P. H., Osten, W. & Gastinger, K. (eds.). SPIE, Vol. 8082. 8 p. 80820Q

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Interferometry
Fast Fourier transform
Convolution
convolution integrals
Fast Fourier transforms
2010
73 Citations (Scopus)

Fast Surface Measurement Using Wavelength Scanning Interferometry with Compensation of Environmental Noise

Jiang, X., Gao, F., Muhamedsalih, H. & Wang, K., 20 May 2010, In : Applied Optics. 49, 15, p. 2903-2909 7 p.

Research output: Contribution to journalArticle

Surface measurement
Interferometry
interferometry
Scanning
Wavelength