If you made any changes in Pure these will be visible here soon.

Research Output 2010 2020

  • 15 Conference contribution
  • 8 Article
  • 1 Conference article
Filter
Article
2020
optical measurement
retarding
filters
Surface topography
Interferometers
2019

Fabrication and characterisation of metal-doped pectin films

Kalathaki, I., Alba, J., Muhamedsalih, H. & Kontogiorgos, V., 1 Jul 2019, In : Food Hydrocolloids. 92, p. 259-266 8 p.

Research output: Contribution to journalArticle

Open Access
File
films (materials)
pectins
Metals
metals
Fabrication
2018
2 Citations (Scopus)
Open Access
Interferometry
interferometry
Scanning
filters
Wavelength
2016
1 Citation (Scopus)
Open Access
Interferometry
interferometry
Scanning
Wavelength
scanning
2015
8 Citations (Scopus)

Implementation of in process surface metrology for R2R flexible PV barrier films

Elrawemi, M., Blunt, L., Muhamedsalih, H., Gao, F. & Fleming, L., 2015, In : International Journal of Automation Technology. 9, 3, p. 312-321 10 p.

Research output: Contribution to journalArticle

Open Access
Atomic layer deposition
Defects
Surface defects
Water vapor
Inspection
2012
18 Citations (Scopus)

Comparison Study of Algorithms and Accuracy in the Wavelength Scanning Interferometry

Jiang, X., Muhamedsalih, H. & Gao, F., 20 Dec 2012, In : Applied Optics. 51, 36, p. 8854-8862 9 p.

Research output: Contribution to journalArticle

Interferometry
interferometry
Scanning
Wavelength
scanning
24 Citations (Scopus)

Surface and Thickness Measurement of a Transparent Film Using Wavelength Scanning Interferometry

Jiang, X., Gao, F. & Muhamedsalih, H., 10 Sep 2012, In : Optics Express. 20, 19, p. 21450-21456 7 p.

Research output: Contribution to journalArticle

Open Access
interferometry
scanning
wavelengths
signal reflection
interferometers
2010
73 Citations (Scopus)

Fast Surface Measurement Using Wavelength Scanning Interferometry with Compensation of Environmental Noise

Jiang, X., Gao, F., Muhamedsalih, H. & Wang, K., 20 May 2010, In : Applied Optics. 49, 15, p. 2903-2909 7 p.

Research output: Contribution to journalArticle

Surface measurement
Interferometry
interferometry
Scanning
Wavelength