Research Output per year
Personal profile
Biography
Jacob began his career at the age of 16 when he became an apprentice mechanical engineer at Cummins Turbo Technologies Huddersfield. During the course of his apprenticeship he studied part time resulting in a HNC in Mechanical Engineering. Once his apprenticeship was complete he continued to study part time whilst maintaing a full time job and in 2015 he graduated Huddersfield University with a upper second class honours degree in Mechanical engineering. He then chose to leave work in 2017 to futher his studies and undertake a PHD at the MIAMI facility at Huddersfield University upgrading a transmission electron microscope with in-situ ion beam line to discover ion irradiation effects in ZrC nanoparticles.
Research Expertise and Interests
Research consists of:
- Radiation damage in materials relevant to the nuclear industry
- Ion Beam systems
- Transmission Electron Microscopy
- Nanoparticles
- Computer Calculations for ion transportation in matter
Education/Academic qualification
Bachelor
30 Sep 2012 → 15 Jul 2015
Research Expertise and Interests
- Transmission Electron Microscopy
- Ion Beams
- Ion Iirradiation
- Ion Implantation
- Materials Analysis
- Irradiation
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Research Output
Enhanced Radiation Tolerance of Tungsten Nanoparticles to He Ion Irradiation
Aradi, E., Lewis-Fell, J., Harrison, R., Greaves, G., Mir, A. H., Donnelly, S. & Hinks, J., 14 Dec 2018, In : Nanomaterials. 8, 12, p. 1-14 14 p., 1052.Research output: Contribution to journal › Article
Open Access
2
Citations
(Scopus)
Low-temperature investigations of ion-induced amorphisation in silicon carbide nanowhiskers under helium irradiation
Aradi, E., Lewis-Fell, J., Greaves, G., Donnelly, S. & Hinks, J., 31 Jan 2020, In : Applied Surface Science. 501, 143969.Research output: Contribution to journal › Article
1
Citation
(Scopus)
Direct Comparison of Tungsten Nanoparticles and Foils under Helium Irradiation at High Temperatures Studied via In-Situ Transmission Electron Microscopy
Aradi, E., Lewis-Fell, J., Harrison, R. W., Greaves, G., Mir, A. H., Donnelly, S. & Hinks, J., Aug 2019, In : Microscopy and Microanalysis. 25, S2, p. 1576-1577 2 p.Research output: Contribution to journal › Meeting Abstract