James Williamson

Personal profile

Biography

Dr James Williamson is a research fellow in the EPSRC Centre for Innovative Manufacturing in Advanced Metrology (CIMAM) at the University of Huddersfield.

James has a BEng degree in Electronic Engineering awarded in 2010 from the University of Surrey. After two years in industry James joined CIMAM in 2012 for his PhD studies to research single-point on-machine metrology, graduating in 2017 with a thesis titled Dispersed Reference Interferometry for On-Machine Metrology.

James’ research interests include fibre-linked single-point metrology instrumentation, on-machine interferometric distance and topography measurement and, high speed fibre-based strain measurement.

Fingerprint Dive into the research topics where James Williamson is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

11 Similar Profiles

Interferometry Engineering & Materials Science

Machining Engineering & Materials Science

interferometry Physics & Astronomy

particle accelerators Physics & Astronomy

tapering Physics & Astronomy

collimators Physics & Astronomy

stems Physics & Astronomy

machining Physics & Astronomy

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 2016 2019

4 Article
3 Conference contribution
1 Chapter

1 Citation (Scopus)

Adaptive Collimator Design for Future Particle Accelerators

Furness, T., Fletcher, S., Williamson, J., Bertarelli, A., Carra, F., Gentini, L., Pasquali, M. & Redaelli, S., 29 Jan 2019, Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018. Schaa, V. RW., Petit-Jean-Genaz, C., Chrin, J., Olander, J. & Chen, Z. (eds.). Joint Accelerator Conferences Website (JACoW), Vol. 187. p. 240-244 5 p.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Open Access

particle accelerators

collimators

collimation

superconducting magnets

cleaning

Changes in the morphology of microgrooved stem tapers with differing assembly conditions

Dransfield, K., Williamson, J., Racasan, R. & Bills, P., Jun 2019, In : Biotribology. 18, p. 1-11 11 p., 100096.

Research output: Contribution to journal › Article

Cones

Plastic deformation

Textures

Corrosion

Geometry

1 Citation (Scopus)

Improvements to dispersed reference interferometry: beyond the linear approximation

Henning, A., Williamson, J., Martin, H. & Jiang, X., 1 Jan 2019, In : Applied Optics. 58, 1, p. 131-136 6 p.

Research output: Contribution to journal › Article

Open Access

Interferometry

interferometry

approximation

Scattering

scattering

The influence of assembly on stem taper texture and measurement uncertainty

Dransfield, K., Racasan, R., Williamson, J., Blunt, L. & Bills, P., 2019, European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 19th International Conference and Exhibition, EUSPEN 2019. Leach, R. K., Billington, D., Nisbet, C. & Phillips, D. (eds.). euspen, p. 530-531 2 p.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

tapering

stems

textures

Textures

assembly