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PhD projects

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Calculated based on number of publications stored in Pure and citations from Scopus
1993 …2024

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  • 2001

    Advances in surface analysis technology

    Jiang, X. Q. & Blunt, L., 2001, Laser Metrology and Machine Performance V. Peggs, G. N. (ed.). WIT Press, p. 247-257 11 p. (Transactions in Engineering Sciences; vol. 34).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Open Access
  • 1997

    Dual Interferometric Displacement Measurement System Incorporating a Wollaston Interferometer

    Kemp, J. E., Jiang, X. Q., Ning, Y. N., Palmer, A. W. & Grattan, K. T. V., 10 Jan 1997, Laser Diode and LED Applications III. Linden, K. J. (ed.). SPIE, Vol. 3000. p. 82-89 8 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 3000).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Citation (Scopus)
  • 1996

    Novel white-light interferometer using an electronically scanned Mach-Zehnder interferometer

    Marshall, R. H., Ning, Y. N., Jiang, X. Q., Palmer, A. W., Meggitt, B. T. & Grattan, K. T., 3 Jan 1996, Self-Calibrated Intelligent Optical Sensors and Systems. Wang, A. (ed.). SPIE, Vol. 2594. p. 159-167 9 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 2594).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    5 Citations (Scopus)
  • 1993

    Design of a surface-roughness measuring sensor with high accuracy and wide dynamic range

    Lu, X-D., Jiang, J., Xie, T-B. & Li, Z., 22 Sep 1993, Proceedings of SPIE - The International Society for Optical Engineering. SPIE, Vol. 2101. p. 348-351 4 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 2101).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Grating technology for topography measurement of curved surfaces

    Jiang, X., Xie, T. B., Yao, C. X. & Li, Z., 22 Sep 1993, Measurement Technology and Intelligent Instruments. Zhu, L. (ed.). SPIE, Vol. 2101. p. 554-557 4 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 2101).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    7 Citations (Scopus)
  • New reference line for estimating roughness of an arbitrary curved surface

    Xiao, S., Jiang, X. & Xie, T. B., 22 Sep 1993, Measurement Technology and Intelligent Instruments. Zhu, L. (ed.). SPIE, Vol. 2101. p. 909-913 5 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 2101).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Research on a new measuring and analyzing system for curved surface topography

    Jiang, X., Gu, T. X. & Li, Z., 22 Sep 1993, Measurement Technology and Intelligent Instruments. Zhu, L. (ed.). SPIE, Vol. 2101. p. 1163-1167 5 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 2101).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Citations (Scopus)