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Personal profile

Biography

Mahbub graduated from the University of Huddersfield in 2014 with a degree in Mechanical Engineering. During his degree he specialised in energy systems, which included advanced nuclear fusion and fission technologies and more conventional systems such as finite material power plants. Other specialist areas include power technologies in machines and drives which are used worldwide and can be found in everyday machinery. In 2013 he joined the IRR as part of the Universities IMechE Railway Challenge team. This included designing, manufacturing and testing a scaled locomotive ready to compete in the 2014 challenge. After graduating Mahbub has started his career within the IRR’s Centre for Innovation in rail (CIR).

Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 9 Similar Profiles
damage Physics & Astronomy
Ions Chemical Compounds
etching Physics & Astronomy
ions Physics & Astronomy
molecular ions Physics & Astronomy
Plasmas Chemical Compounds
optimization Physics & Astronomy
Reactive ion etching Chemical Compounds

Research Output 1999 2001

  • 2 Article
  • 1 Conference article
7 Citations

Minimization of dry etch damage in III-V semiconductors

Rahman, M., Deng, L. G., Van Den Berg, J. & Wilkinson, C. D. W., 5 Sep 2001, In : Journal of Physics D: Applied Physics. 34, 18, p. 2792-2797 6 p.

Research output: Contribution to journalArticle

Ions
damage
optimization
Etching
Lighting
14 Citations

Studies of damage in low-power reactive-ion etching of III-V semiconductors

Rahman, M., Deng, L. G., Wilkinson, C. D. W. & Van Den Berg, J. A., 15 Feb 2001, In : Journal of Applied Physics. 89, 4, p. 2096-2108 13 p.

Research output: Contribution to journalArticle

etching
damage
ions
molecular ions
deceleration
3 Citations

Design considerations for low damage process plasmas

Rahman, M., Deng, L. G., Boyd, A., Ribayrol, A., Wilkinson, C. D. W., Van Den Berg, J. A. & Armour, D. G., May 1999, In : Microelectronic Engineering. 46, 1-4, p. 299-302 4 p.

Research output: Contribution to journalConference article

Ions
damage
Plasmas
ions
molecular ions