Research Output per year
Personal profile
Biography
Dr Prashant Kumar is a research fellow in the EPSRC Centre for Innovative Manufacturing in Advanced Metrology (CIMAM) at the University of Huddersfield.
Prashant graduated with a 5 Year Integrated Master's degree in Photonics in April 2010 from the `Centre of Excellence in Lasers and Optoelectronic Sciences' of Cochin University of Science and Technology, India. Thereafter on obtaining a research scholarship from the University of Huddersfield, he moved to UK for his doctoral studies under the supervision of Professor Xiangqian Jiang and Dr Haydn Martin. He worked on developing low-cost integrated optics based miniaturised metrology sensor for embedded metrology applications. He received his PhD degree in 2015 with a thesis titled “Design and development of an optical chip interferometer for high precision on-line surface measurement”.
Fingerprint Dive into the research topics where Prashant Kumar is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
Surface measurement
Engineering & Materials Science
Interferometers
Engineering & Materials Science
Photonics
Engineering & Materials Science
Interferometry
Engineering & Materials Science
interferometers
Physics & Astronomy
chips
Physics & Astronomy
metrology
Physics & Astronomy
Metrology
Mathematics
Research Output 2014 2018
Phase retrieval algorithm for line-scan dispersive interferometry
Tang, D., Kumar, P., Gao, F. & Jiang, X., 24 Jul 2018, Sixth International Conference on Optical and Photonic Engineering, icOPEN 2018. Zuo, C., Yu, Y. & Qian, K. (eds.). SPIE, Vol. 10827. 6 p. PEN100-129. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 10827).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Open Access
File
Interferometry
Diffraction gratings
Charge coupled devices
Interferometers
Pixels
2
Citations
(Scopus)
Towards the development of a hybrid-integrated chip interferometer for online surface profile measurements
Kumar, P., Martin, H. & Jiang, X., Jun 2016, In : Review of Scientific Instruments. 87, 6, 10 p., 065103.Research output: Contribution to journal › Article
Open Access
Surface measurement
Interferometers
interferometers
chips
profiles
1
Citation
(Scopus)
A hybrid photonics based sensor for surface measurement
Martin, H., Kumar, P. & Jiang, X., 2014, In : CIRP Annals - Manufacturing Technology. 63, 1, p. 549-552 4 p.Research output: Contribution to journal › Article
Surface measurement
Photonics
Wavelength
Sensors
Photonic devices
Hybrid photonic chip interferometer for embedded metrology
Kumar, P., Martin, H., Maxwell, G. & Jiang, X., 2014, Integrated Optics: Devices, Materials, and Technologies XVIII. SPIE, Vol. 8988. 89880NResearch output: Chapter in Book/Report/Conference proceeding › Conference contribution
Metrology
Photonics
Interferometer
Interferometers
metrology
Activities 2009 2018
- 3 Oral presentation
Phase retrieval algorithm for line-scan dispersive interferometry
Dawei Tang (Speaker), Prashant Kumar (Speaker), Feng Gao (Speaker), Jane Jiang (Speaker)9 May 2018
Activity: Talk or presentation types › Oral presentation
Hybrid Photonic Chip Interferometer for Embedded Metrology
Prashant Kumar (Speaker), Haydn Martin (Speaker), Jane Jiang (Speaker), Graeme Maxwell (Speaker)4 Feb 2014
Activity: Talk or presentation types › Oral presentation
Studies on the resistance switching characteristics of the pulse laser deposited ZnO thin film for non-volatile memory application
Prashant Kumar (Speaker), Amit Das (Speaker), Pankaj Misra (Speaker), Lalit Mohan Kukreja (Speaker)2 Dec 2009
Activity: Talk or presentation types › Oral presentation