Research Output per year
Personal profile
Biography
Dr Prashant Kumar is a research fellow in the EPSRC Centre for Innovative Manufacturing in Advanced Metrology (CIMAM) at the University of Huddersfield.
Prashant graduated with a 5 Year Integrated Master's degree in Photonics in April 2010 from the `Centre of Excellence in Lasers and Optoelectronic Sciences' of Cochin University of Science and Technology, India. Thereafter on obtaining a research scholarship from the University of Huddersfield, he moved to UK for his doctoral studies under the supervision of Professor Xiangqian Jiang and Dr Haydn Martin. He worked on developing low-cost integrated optics based miniaturised metrology sensor for embedded metrology applications. He received his PhD degree in 2015 with a thesis titled “Design and development of an optical chip interferometer for high precision on-line surface measurement”.
Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.
- 5 Similar Profiles
Surface measurement
Engineering & Materials Science
Interferometers
Engineering & Materials Science
Photonics
Engineering & Materials Science
metrology
Physics & Astronomy
Interferometry
Engineering & Materials Science
interferometers
Physics & Astronomy
chips
Physics & Astronomy
profilometers
Physics & Astronomy
Network
Recent external collaboration on country level. Dive into details by clicking on the dots.
Research Output 2014 2018
Phase retrieval algorithm for line-scan dispersive interferometry
Tang, D., Kumar, P., Gao, F. & Jiang, X. 24 May 2018 (Accepted/In press) International Conference on Optical and Photonic Engineering (icOPEN 2018). SPIE, 6 p. PEN100-129Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Interferometry
Diffraction gratings
Charge coupled devices
Interferometers
Pixels
Towards the development of a hybrid-integrated chip interferometer for online surface profile measurements
Kumar, P., Martin, H. & Jiang, X. Jun 2016 In : Review of Scientific Instruments. 87, 6, 10 p., 065103Research output: Contribution to journal › Article
Open Access
Surface measurement
Interferometers
interferometers
chips
profiles
A hybrid photonics based sensor for surface measurement
Martin, H., Kumar, P. & Jiang, X. 2014 In : CIRP Annals - Manufacturing Technology. 63, 1, p. 549-552 4 p.Research output: Contribution to journal › Article
Surface measurement
Photonics
Wavelength
Sensors
Photonic devices
Hybrid photonic chip interferometer for embedded metrology
Kumar, P., Martin, H., Maxwell, G. & Jiang, X. 2014 Integrated Optics: Devices, Materials, and Technologies XVIII. SPIE, Vol. 8988, 89880NResearch output: Chapter in Book/Report/Conference proceeding › Conference contribution
Metrology
Photonics
Interferometer
Interferometers
metrology
Activities 2014 2014
- 1 Oral presentation
Hybrid Photonic Chip Interferometer for Embedded Metrology
Kumar, P. (Speaker), Martin, H. (Speaker), Jiang, X. (Speaker), Graeme Maxwell (Speaker)4 Feb 2014
Activity: Oral presentation