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Personal profile

Biography

Dr Prashant Kumar is a research fellow in the EPSRC Centre for Innovative Manufacturing in Advanced Metrology (CIMAM) at the University of Huddersfield.

Prashant graduated with a 5 Year Integrated Master's degree in Photonics in April 2010 from the `Centre of Excellence in Lasers and Optoelectronic Sciences' of Cochin University of Science and Technology, India. Thereafter on obtaining a research scholarship from the University of Huddersfield, he moved to UK for his doctoral studies under the supervision of Professor Xiangqian Jiang and Dr Haydn Martin. He worked on developing low-cost integrated optics based miniaturised metrology sensor for embedded metrology applications. He received his PhD degree in 2015 with a thesis titled “Design and development of an optical chip interferometer for high precision on-line surface measurement”.

Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 5 Similar Profiles
Surface measurement Engineering & Materials Science
Interferometers Engineering & Materials Science
Photonics Engineering & Materials Science
metrology Physics & Astronomy
Interferometry Engineering & Materials Science
interferometers Physics & Astronomy
chips Physics & Astronomy
profilometers Physics & Astronomy

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Research Output 2014 2018

  • 2 Conference contribution
  • 2 Article

Phase retrieval algorithm for line-scan dispersive interferometry

Tang, D., Kumar, P., Gao, F. & Jiang, X. 24 May 2018 (Accepted/In press) International Conference on Optical and Photonic Engineering (icOPEN 2018). SPIE, 6 p. PEN100-129

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Interferometry
Diffraction gratings
Charge coupled devices
Interferometers
Pixels
Open Access
Surface measurement
Interferometers
interferometers
chips
profiles
1 Citations

A hybrid photonics based sensor for surface measurement

Martin, H., Kumar, P. & Jiang, X. 2014 In : CIRP Annals - Manufacturing Technology. 63, 1, p. 549-552 4 p.

Research output: Contribution to journalArticle

Surface measurement
Photonics
Wavelength
Sensors
Photonic devices

Hybrid photonic chip interferometer for embedded metrology

Kumar, P., Martin, H., Maxwell, G. & Jiang, X. 2014 Integrated Optics: Devices, Materials, and Technologies XVIII. SPIE, Vol. 8988, 89880N

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Metrology
Photonics
Interferometer
Interferometers
metrology

Activities 2014 2014

  • 1 Oral presentation

Hybrid Photonic Chip Interferometer for Embedded Metrology

Kumar, P. (Speaker), Martin, H. (Speaker), Jiang, X. (Speaker), Graeme Maxwell (Speaker)
4 Feb 2014

Activity: Oral presentation