Research output per year
Research output per year
Personal profile
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2 Last checked 30 June 2020
Biography
Dr Prashant Kumar is a research fellow in the EPSRC Centre for Innovative Manufacturing in Advanced Metrology (CIMAM) at the University of Huddersfield.
Prashant graduated with a 5 Year Integrated Master's degree in Photonics in April 2010 from the `Centre of Excellence in Lasers and Optoelectronic Sciences' of Cochin University of Science and Technology, India. Thereafter on obtaining a research scholarship from the University of Huddersfield, he moved to UK for his doctoral studies under the supervision of Professor Xiangqian Jiang and Dr Haydn Martin. He worked on developing low-cost integrated optics based miniaturised metrology sensor for embedded metrology applications. He received his PhD degree in 2015 with a thesis titled “Design and development of an optical chip interferometer for high precision on-line surface measurement”.
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Research output
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Extended sub-surface imaging in industrial OCT using ‘non-diffracting’ Bessel beams
Martin, H., Kumar, P., Henning, A. & Jiang, X., 1 Jun 2020, In: CIRP Annals. 69, 1, p. 493-496 4 p.Research output: Contribution to journal › Article › peer-review
Open Access1 Citation (Scopus) -
Phase retrieval algorithm for line-scan dispersive interferometry
Tang, D., Kumar, P., Gao, F. & Jiang, X., 24 Jul 2018, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018). Yu, Y., Zuo, C. & Qian, K. (eds.). SPIE, Vol. 10827. 6 p. 108270F. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 10827).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Open AccessFile2 Citations (Scopus) -
Towards the development of a hybrid-integrated chip interferometer for online surface profile measurements
Kumar, P., Martin, H. & Jiang, X., Jun 2016, In: Review of Scientific Instruments. 87, 6, 10 p., 065103.Research output: Contribution to journal › Article › peer-review
Open Access3 Citations (Scopus) -
A hybrid photonics based sensor for surface measurement
Martin, H., Kumar, P. & Jiang, X., 2014, In: CIRP Annals - Manufacturing Technology. 63, 1, p. 549-552 4 p.Research output: Contribution to journal › Article › peer-review
1 Citation (Scopus) -
Hybrid Photonic Chip Interferometer for Embedded Metrology
Kumar, P., Martin, H., Maxwell, G. & Jiang, X., 8 Mar 2014, Integrated Optics: Devices, Materials, and Technologies XVIII. Broquin, J. E. & Conti, G. N. (eds.). SPIE, Vol. 8988. 10 p. 89880N. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 8988).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Activities
- 3 Oral presentation
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Phase retrieval algorithm for line-scan dispersive interferometry
Dawei Tang (Speaker), Prashant Kumar (Speaker), Feng Gao (Speaker) & Jane Jiang (Speaker)
9 May 2018Activity: Talk or presentation types › Oral presentation
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Hybrid Photonic Chip Interferometer for Embedded Metrology
Prashant Kumar (Speaker), Haydn Martin (Speaker), Jane Jiang (Speaker) & Graeme Maxwell (Speaker)
4 Feb 2014Activity: Talk or presentation types › Oral presentation
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Studies on the resistance switching characteristics of the pulse laser deposited ZnO thin film for non-volatile memory application
Prashant Kumar (Speaker), Amit Das (Speaker), Pankaj Misra (Speaker) & Lalit Mohan Kukreja (Speaker)
2 Dec 2009Activity: Talk or presentation types › Oral presentation