If you are interested in studying for a PhD in this research subject area click here

For more details about the research topics, expertise and interests of this academic, click on the fingerprint icon

18 from 936 citations 

Last updated 16th March 2023

Dr Wenhan Zeng is a Principal Research Fellow with the Surface Metrology Group (SMG) of the Centre for Precision Technologies (CPT) and the EPSRC Future Metrology Hub. He received his BEng in mechanical engineering and MEng in Precision instrumentation from Huazhong University of Science and Technology (HUST), China. He finished his PhD in 2005 and his PhD thesis was awarded as one of the Best Dissertations in HUST in 2005.

Since joining the University of Huddersfield in 2003, Wenhan has been working in the Centre for Precision Technologies (Previously the EPSRC Centre for Innovative Manufacturing in Advanced Metrology (EPSRC CIMAM), now the EPSRC Future Metrology Hub) for over 10 years: one year as a visiting scholar, 7 years as the Research Fellow in CPT, and in 2011 was promoted to the post of Senior Research Fellow.

Wenhan has more than 20 years’ research experience in Surface metrology and Precision metrology. His research has mainly been focusing on precision engineering, precision measurement, surface metrology, signal/image processing as well as the application of developing algorithms and software for precision metrology.

As an active researcher in surface metrology area, Wenhan has published over 100 research papers. His main contributions are:

• Wenhan was the main researcher of EPSRC funded project “New Geometrical Filtration for Ultra-Precision and Micro/Nano Manufactured Products” (EP/F032242/1). This project helped the UK to build its standard software and the project output also helped the UK instrument manufacture (Taylor-Hobson) to update their software to keep their world leading technological advantage in the field. This project was assessed by EPSRC as “Outstanding”.
• Wenhan has also been actively involved in developing new generation ISO GPS standards. He has been working with the leading ISO GPS experts Prof. Paul Scott and Prof. Jane Jiang, involved in drafting the ISO GPS standard ISO16610-29: Linear profile filters: Spline wavelet, as well as developing its reference algorithm and fast algorithm for wider academic/industry application. He has also developed reference algorithms and the fast algorithms for: (1) ISO16610-21: Linear profile filters: Gaussian filters; (2) ISO16610-31: Robust profile filters: Gaussian regression filters; (3) ISO16610-32: Robust profile filters: Spline filters; (4) ISO16610-61: Linear areal filters - Gaussian filters; (5) ISO16610-71: Robust areal filters - Gaussian regression filters.

The outputs of above two works have significant contributions to the latest REF21 impact case studies (https://results2021.ref.ac.uk/impact/33cb6492-d9e0-405c-81d2-8cbce1b88679?page=1)

• Wenhan was the main researcher of the EPSRC funded project “Third Generation Wavelet for the Extraction of Morphological from Micro and Nano Scalar Surfaces” (GR/S13316/01). The research outputs of this project were successfully used in wider metrology applications: (1) seven software packages have been accepted for the UK’s national measurement software database; (2) one draft International Standard Organization (ISO) standard was proposed for consideration. The research results have also been extended and very successfully used in (a) vibration analysis of the Watt balance instrument used in experiments supporting the definition of the kilogram international standard prototype system at NPL, and (b) detection and isolation of transition vibration signals in earth orbiting satellites by the NPL for the European Space Agency.  This project was assessed by EPSRC as “Outstanding”.

The project’s output significantly contributed to REF14 impact case studies (http://impact.ref.ac.uk/CaseStudies/CaseStudy.aspx?Id=35580)

• Wenhan was one of the primary researchers on the EPSRC project “Novel Metrology-based Control Algorithms for Precision Manufacture”(GR/R13401/01). In this project, he used 3D surface characterisation techniques to monitor manufacturing operations. He was the first researcher to use areal auto-correlation function (AACF) and pattern analysis to illustrate the effects of tool wear on the workpiece surface. The output of this project was rated as “Outstanding” by EPSRC assessment panel.

The project’s output contributed to REF14 impact case studies (http://impact.ref.ac.uk/CaseStudies/CaseStudy.aspx?Id=34394)

Current Project

• Manufacturing in the UK for High Gradient Cavities (MUHiG), UK STFC-IPS project, £268K, ST/W005263/1, 2022-2024, lead ultra-precision machining WP, PI
• Transferring technology in optimised metal mirror fabrication, UK STFC-IPS project, £450K, ST/V001280/1, 2022-2023, lead diamond machining WP, CI
• A toolbox for freeform triangle mesh surface characterisation and its verification method, UK EPSRC Future Metrology Hub – Innovation Project (in partnership with DIGITAL SURF SARL), £80K, 2023-2024, PI
• Investigation of dimensional accuracy and surface roughness of polymeric parts manufactured by additive manufacturing , UK EPSRC Future Metrology Hub – Innovation Project (in partnership with Sartorius Stedim Lab Ltd.), £80K, 2023-2024, CI
• FRAMEWORK AGREEMENT FOR COLLABORATION, KNOW-HOW LICENCE AND TECHNICAL ASSISTANCE, Industry project, Digital surf, 81K, 2021-2023, PI
• Future Advanced Metrology Hub , UK EPSRC project, 2017-2023, £12.5M, CI

Current PhD 

• Mr B. Mutiargo 2023-2025 Master by Research co-supervision: Fast surface determination method based on XCT simulation and machine Learning
• Mr. Sumit Kumar, 2020-2024: Design and manufacture of freeform functional surfaces in novel optical materials
• Mr. Maomao Wang, 2021-2025: Development of a Data Driven Informative System for On Machine Quality Control
• Mr S. Narasimharaju, 2019-2023: Investigation of microstructure, surface texture and mechanical properties of SLM of steels
• Ms X. Chen, 2019-2023: Investigation and improvement of XCT structure resolution for AM surface texture measurement
• Ms H. Huang, 2020-2024: Advanced data processing for smart metrology of complex surfaces from high value-added products
• Ms W. Cui, 2020-2024: Intelligent characterization for the complex freeform structured surface
• Mr. Weidong. Liu, 2022-2026 : Investigation of uncertainty and calibration for dimensional XCT measurement
• Mr. Ronnie Ssebaggala, 2022-2026: Precision metrology of additively manufactured lattice structures using industrial X-Ray computed tomography
• Mr D. Broadbent, 2021-2025: Development of a modular reference artifact to characterise XCT systems performance and facilitate the adoption of additive manufacturing technologies
• Mr K. A. Anowa, 2021-2025: Geometrical measurement of 3D printed healthcare products using X-ray computed tomography