Nanoscale Defect Detection, Cleaning and Repair for Large Area Substrates

Research output

Research output per year 2014 2014 2015 2015

• 4 Conference contribution
• 1 Article

Research output per year

Research output per year

Search results

• 2015

  A computerised data handling procedure for defect detection and analysis for large area substrates manufactured by roll-to-roll process

  Muhamedsalih, H., Elrawemi, M., Blunt, L., Lan, X. & Martin, H., 2015, Laser Metrology and Machine Performance XI - 11th International Conference and Exhibition on Laser Metrology, Machine Tool, CMM and Robotic Performance, LAMDAMAP 2015. euspen, p. 82-89 8 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • Defect Detection 100%
  • Data Handling 80%
  • Substrate 63%
  • Defects 54%
  • files 37%

• An integrated opto-mechanical measurement system for in-process defect measurement on a roll-to-roll process

  Muhamedsalih, H., Blunt, L., Martin, H., Hamersma, I., Elrawemi, M. & Gao, F., 2015, Laser Metrology and Machine Performance XI - 11th International Conference and Exhibition on Laser Metrology, Machine Tool, CMM and Robotic Performance, LAMDAMAP 2015. euspen, p. 97-105 9 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • Measurement System 100%
  • mechanical measurement 88%
  • Mechanical Systems 68%
  • Defects 66%
  • foils 58%
  4 Citations (Scopus)

• Implementation of wavelength scanning interferometry for R2R flexible PV barrier films

  Blunt, L., Muhamedsalih, H., Elrawemi, M., Martin, H., Hamersma, I., Gao, F. & Jiang, X., 2015, Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015. euspen, p. 199-200 2 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • Interferometry 100%
  • barrier layers 79%
  • interferometry 79%
  • Interferometers 68%
  • Wavelength 64%
• 2014

  An interferometric auto-focusing method for on-line defect assessment on a roll-to-roll process using wavelength scanning interferometry

  Muhamedsalih, H., Blunt, L., Martin, H., Jiang, X. & Elrawemi, M., 2014, Conference Proceedings - 14th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2014. euspen, Vol. 1. p. 177-180 4 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • Atomic layer deposition 100%
  • Interferometry 88%
  • Atomic Layer Epitaxy 75%
  • barrier layers 70%
  • interferometry 70%
  2 Citations (Scopus)

• Modelling water vapour permeability through atomic layer deposition coated photovoltaic barrier defects

  Elrawemi, M., Blunt, L., Fleming, L., Bird, D., Robbins, D. & Sweeney, F., 3 Nov 2014, In: Thin Solid Films. 570, PartA, p. 101-106 6 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  • Atomic layer deposition 100%
  • Atomic Layer Epitaxy 75%
  • Water vapor 72%
  • atomic layer epitaxy 67%
  • water vapor 65%
  14 Citations (Scopus)