Fingerprint
Dive into the research topics of 'A comparison of atom and ion induced SSIMS-Evidence for a charge induced damage effect in insulator materials'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
A comparison of atom and ion induced SSIMS-Evidence for a charge induced damage effect in insulator materials
A. Brown, J. A. van den Berg, J. C. Vickerman
Research output: Contribution to journal › Article › peer-review
41
Citations
(Scopus)