A displacement measurement system, utilizing a Wollaston interferometer

J. Kemp, X. Q. Jiang, Y. N. Ning, A. W. Palmer, K. T.V. Grattan

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

A dual interferometric displacement measurement system is presented where a Wollaston prism interferometer is employed in conjunction with a normal Michelson interferometer. The system operates without the use of external polarizers, apart from those associated with the Wollaston prism interferometer itself. It is shown that an optical path difference induced in the Michelson interferometer can be detected using the Wollaston prism in a normal interferometer arrangement. Further, the interference pattern produced by the Wollaston prism interferometer changes in a measurable, linear fashion as the optical path difference from the Michelson interferometer alters. A simple theoretical analysis of the system is presented and used to derive a computer model of the optical arrangement. Results from an experimental implementation of the system, using a Wollaston prism with a beam separation of 0.5 degrees and a superluminescent diode, of wavelength 825 nm, as a light source, are included and compared to the results from the computer model.

Original languageEnglish
Pages (from-to)71-75
Number of pages5
JournalOptics and Laser Technology
Volume30
Issue number1
DOIs
Publication statusPublished - 1 Feb 1998
Externally publishedYes

    Fingerprint

Cite this