A low energy ion beam system for thermal evolution measurements of damage in ion bombarded single crystals

P. Bailey, SE Donnelly, DC Ingram, DG Armour

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The use of thermal evolution mass spectrometry in conjunction with the helium probe represents a powerful method of studying the gas-defect interaction processes associated with ion bombardment of single crystal targets. The energy and fluence dependence of the damage build-up processes together with the annealing characteristics of the damage are of considerable importance in view of the widespread use of low energy ion beam and plasma cleaning techniques. The apparatus described comprises a low energy ion gun based on an electron bombardment source and Wien filter and target chamber incorporating a multiple target holder assembly. The design considerations and operating characteristics of the overall system are described and the often used ion bombardment cleaning procedures discussed with reference to experimental thermal evolution measurements of low energy argon and helium trapping.

Original languageEnglish
Pages (from-to)239-244
Number of pages6
JournalVacuum
Volume34
Issue number1-2
DOIs
Publication statusPublished - 1 Jan 1984
Externally publishedYes

Fingerprint

Helium
Ion bombardment
Ion beams
Cleaning
ion beams
Single crystals
Ions
damage
Argon
single crystals
Ion sources
cleaning
Mass spectrometry
bombardment
ions
Gases
helium
Annealing
Plasmas
Defects

Cite this

Bailey, P. ; Donnelly, SE ; Ingram, DC ; Armour, DG. / A low energy ion beam system for thermal evolution measurements of damage in ion bombarded single crystals. In: Vacuum. 1984 ; Vol. 34, No. 1-2. pp. 239-244.
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A low energy ion beam system for thermal evolution measurements of damage in ion bombarded single crystals. / Bailey, P.; Donnelly, SE; Ingram, DC; Armour, DG.

In: Vacuum, Vol. 34, No. 1-2, 01.01.1984, p. 239-244.

Research output: Contribution to journalArticle

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