A new entropy measure based on the wavelet transform and noise modeling

J. L. Starck, F. Murtagh, R. Gastaud

Research output: Contribution to journalArticle

38 Citations (Scopus)

Abstract

We present in this brief a new way to measure the information in a signal, based on noise modeling. We show that the use of such an entropy-related measure leads to good results for signal restoration.

Original languageEnglish
Pages (from-to)1118-1124
Number of pages7
JournalIEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing
Volume45
Issue number8
DOIs
Publication statusPublished - 1 Aug 1998
Externally publishedYes

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Wavelet transforms
Restoration
Entropy

Cite this

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A new entropy measure based on the wavelet transform and noise modeling. / Starck, J. L.; Murtagh, F.; Gastaud, R.

In: IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, Vol. 45, No. 8, 01.08.1998, p. 1118-1124.

Research output: Contribution to journalArticle

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KW - image reconstruction

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