A new method to characterize the structured tessellation surface

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1 Citation (Scopus)

Abstract

Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.

Original languageEnglish
Pages (from-to)155-161
Number of pages7
JournalProcedia CIRP
Volume10
DOIs
Publication statusPublished - 2013

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