A new method to characterize the structured tessellation surface

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2 Citations (Scopus)


Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.

Original languageEnglish
Pages (from-to)155-161
Number of pages7
JournalProcedia CIRP
Early online date19 Sep 2013
Publication statusPublished - 19 Sep 2013
Event12th CIRP Conference on Computer Aided Tolerancing - Huddersfield, United Kingdom
Duration: 18 Apr 201219 Apr 2012
https://www.tib.eu/en/search/id/TIBKAT%3A784140057/12th-CIRP-Conference-on-Computer-Aided-Tolerancing/ (Link to Conference Details )


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