Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.
|Number of pages||7|
|Early online date||19 Sep 2013|
|Publication status||Published - 19 Sep 2013|
|Event||12th CIRP Conference on Computer Aided Tolerancing - Huddersfield, United Kingdom|
Duration: 18 Apr 2012 → 19 Apr 2012
https://www.tib.eu/en/search/id/TIBKAT%3A784140057/12th-CIRP-Conference-on-Computer-Aided-Tolerancing/ (Link to Conference Details )