A new method to characterize the structured tessellation surface

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1 Citation (Scopus)

Abstract

Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.

Original languageEnglish
Pages (from-to)155-161
Number of pages7
JournalProcedia CIRP
Volume10
DOIs
Publication statusPublished - 2013

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Surface structure
Spectrum analysis
Processing

Cite this

@article{b5ec023d9ed14bb6950fb79437fe05ac,
title = "A new method to characterize the structured tessellation surface",
abstract = "Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.",
keywords = "AACF, Structured surface, Surface characterisation, Tessellation surface",
author = "Wenhan Zeng and Xiangqian Jiang and Scott, {Paul J.} and Tukun Li",
year = "2013",
doi = "10.1016/j.procir.2013.08.026",
language = "English",
volume = "10",
pages = "155--161",
journal = "Procedia CIRP",
issn = "2212-8271",
publisher = "Elsevier",

}

TY - JOUR

T1 - A new method to characterize the structured tessellation surface

AU - Zeng, Wenhan

AU - Jiang, Xiangqian

AU - Scott, Paul J.

AU - Li, Tukun

PY - 2013

Y1 - 2013

N2 - Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.

AB - Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.

KW - AACF

KW - Structured surface

KW - Surface characterisation

KW - Tessellation surface

UR - http://www.scopus.com/inward/record.url?scp=84884864377&partnerID=8YFLogxK

U2 - 10.1016/j.procir.2013.08.026

DO - 10.1016/j.procir.2013.08.026

M3 - Article

VL - 10

SP - 155

EP - 161

JO - Procedia CIRP

JF - Procedia CIRP

SN - 2212-8271

ER -