A new method to characterize the structured tessellation surface

Wenhan Zeng; Xiangqian Jiang; Paul J. Scott; Tukun Li

doi:10.1016/j.procir.2013.08.026

A new method to characterize the structured tessellation surface

Wenhan Zeng, Xiangqian Jiang, Paul J. Scott, Tukun Li

Research output: Contribution to journal › Conference article › peer-review

3 Citations (Scopus)

Abstract

Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.

Original language	English
Pages (from-to)	155-161
Number of pages	7
Journal	Procedia CIRP
Volume	10
Early online date	19 Sept 2013
DOIs	https://doi.org/10.1016/j.procir.2013.08.026
Publication status	Published - 19 Sept 2013
Event	12th CIRP Conference on Computer Aided Tolerancing - Huddersfield, United Kingdom Duration: 18 Apr 2012 → 19 Apr 2012 https://www.tib.eu/en/search/id/TIBKAT%3A784140057/12th-CIRP-Conference-on-Computer-Aided-Tolerancing/ (Link to Conference Details )

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10.1016/j.procir.2013.08.026Licence: CC BY-NC-ND

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@article{b5ec023d9ed14bb6950fb79437fe05ac,

title = "A new method to characterize the structured tessellation surface",

abstract = "Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.",

keywords = "AACF, Structured surface, Surface characterisation, Tessellation surface",

author = "Wenhan Zeng and Xiangqian Jiang and Scott, \{Paul J.\} and Tukun Li",

year = "2013",

month = sep,

day = "19",

doi = "10.1016/j.procir.2013.08.026",

language = "English",

volume = "10",

pages = "155--161",

journal = "Procedia CIRP",

issn = "2212-8271",

publisher = "Elsevier BV",

note = "12th CIRP Conference on Computer Aided Tolerancing, CIRP CAT 2012 ; Conference date: 18-04-2012 Through 19-04-2012",

url = "https://www.tib.eu/en/search/id/TIBKAT\%3A784140057/12th-CIRP-Conference-on-Computer-Aided-Tolerancing/",

}

TY - JOUR

T1 - A new method to characterize the structured tessellation surface

AU - Zeng, Wenhan

AU - Jiang, Xiangqian

AU - Scott, Paul J.

AU - Li, Tukun

PY - 2013/9/19

Y1 - 2013/9/19

N2 - Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.

AB - Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.

KW - AACF

KW - Structured surface

KW - Surface characterisation

KW - Tessellation surface

UR - https://www.scopus.com/pages/publications/84884864377

U2 - 10.1016/j.procir.2013.08.026

DO - 10.1016/j.procir.2013.08.026

M3 - Conference article

AN - SCOPUS:84884864377

SN - 2212-8271

VL - 10

SP - 155

EP - 161

JO - Procedia CIRP

JF - Procedia CIRP

T2 - 12th CIRP Conference on Computer Aided Tolerancing

Y2 - 18 April 2012 through 19 April 2012

ER -

A new method to characterize the structured tessellation surface

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