TY - JOUR
T1 - A Review of Measurement and Characterization of Film Layers of Perovskite Solar Cells by Spectroscopic Ellipsometry
AU - Ma, Liyuan
AU - Xu, Xipeng
AU - Cui, Changcai
AU - Li, Tukun
AU - Lou, Shan
AU - Scott, Paul
AU - Jiang, Jane
AU - Zeng, Wenhan
N1 - Funding Information:
This research was funded by National Nature Science Foundation of China, grant number 52275531, China Scholarship Council, grant number 202308350011.
Funding Information:
The authors from the University of Huddersfield gratefully acknowledge the UK\u2019s Engineering and Physical Sciences Research Council (EPSRC) funding of the Future Metrology Hub (EP/P006930/1).
Publisher Copyright:
© 2025 by the authors.
PY - 2025/2/13
Y1 - 2025/2/13
N2 - This article aims to complete a review of current literature describing the measurement and characterization of photoelectric and geometric properties of perovskite solar cell (PSC) film layer materials using the spectroscopic ellipsometry (SE) measurement technique. Firstly, the influence of film quality on the performance of PSCs is combed and analyzed. Secondly, SE measurement technology is systematically introduced, including the measurement principle and data analysis. Thirdly, a detailed summary is provided regarding the characterization of the geometric and optoelectronic properties of the substrate, electron transport layer (ETL), perovskite layer, hole transport layer (HTL), and metal electrode layer using SE. The oscillator models commonly used in fitting film layer materials in PSCs are comprehensively summarized. Fourthly, the application of SE combined with various measurement techniques to assess the properties of film layer materials in PSCs is presented. Finally, the noteworthy direction of SE measurement technology in the development of PSCs is discussed. The review serves as a valuable reference for further enhancing the application of SE in PSCs, ultimately contributing to the commercialization of PSCs.
AB - This article aims to complete a review of current literature describing the measurement and characterization of photoelectric and geometric properties of perovskite solar cell (PSC) film layer materials using the spectroscopic ellipsometry (SE) measurement technique. Firstly, the influence of film quality on the performance of PSCs is combed and analyzed. Secondly, SE measurement technology is systematically introduced, including the measurement principle and data analysis. Thirdly, a detailed summary is provided regarding the characterization of the geometric and optoelectronic properties of the substrate, electron transport layer (ETL), perovskite layer, hole transport layer (HTL), and metal electrode layer using SE. The oscillator models commonly used in fitting film layer materials in PSCs are comprehensively summarized. Fourthly, the application of SE combined with various measurement techniques to assess the properties of film layer materials in PSCs is presented. Finally, the noteworthy direction of SE measurement technology in the development of PSCs is discussed. The review serves as a valuable reference for further enhancing the application of SE in PSCs, ultimately contributing to the commercialization of PSCs.
KW - perovskite solar cells
KW - spectroscopic ellipsometry
KW - film quality
KW - photoelectric properties
KW - geometrical properties
UR - http://www.scopus.com/inward/record.url?scp=85218988094&partnerID=8YFLogxK
U2 - 10.3390/nano15040282
DO - 10.3390/nano15040282
M3 - Review article
VL - 15
JO - Nanomaterials
JF - Nanomaterials
SN - 2079-4991
IS - 4
M1 - 282
ER -
