Absolute height measurement of specular surfaces with modified active fringe reflection photogrammetry

Hongyu Ren, Xiangqian Jiang, Feng Gao, Zhonghua Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Deflectometric methods have been studied for more than a decade for slope measurement of specular freeform surfaces through utilization of the deformation of a sample pattern after reflection from a tested sample surface. Usually, these approaches require two-directional fringe patterns to be projected on a LCD screen or ground glass and require slope integration, which leads to some complexity for the whole measuring process. This paper proposes a new mathematical measurement model for measuring topography information of freeform specular surfaces, which integrates a virtual reference specular surface into the method of active fringe reflection photogrammetry and presents a straight-forward relation between height of the tested surface and phase signals. This method only requires one direction of horizontal or vertical sinusoidal fringe patterns to be projected from a LCD screen, resulting in a significant reduction in capture time over established methods. Assuming the whole system has been precalibrated during the measurement process, the fringe patterns are captured separately via the virtual reference and detected freeform surfaces by a CCD camera. The reference phase can be solved according to the spatial geometric relation between the LCD screen and the CCD camera. The captured phases can be unwrapped with a heterodyne technique and optimum frequency selection method. Based on this calculated unwrapped-phase and that proposed mathematical model, absolute height of the inspected surface can be computed. Simulated and experimental results show that this methodology can conveniently calculate topography information for freeform and structured specular surfaces without integration and reconstruction processes.

LanguageEnglish
Title of host publicationInterferometry XVII: Advanced Applications
PublisherSPIE
Volume9204
ISBN (Electronic)9781628412314
DOIs
Publication statusPublished - 2014
EventInterferometry XVII: Advanced Applications - San Diego, United States
Duration: 18 Aug 201420 Aug 2014

Conference

ConferenceInterferometry XVII
CountryUnited States
CitySan Diego
Period18/08/1420/08/14

Fingerprint

Photogrammetry
photogrammetry
Free-form Surface
CCD Camera
Topography
Liquid crystal displays
Slope
diffraction patterns
CCD cameras
Heterodyne
topography
Straight
slopes
Horizontal
Vertical
Integrate
Mathematical Model
Calculate
Methodology
Experimental Results

Cite this

Ren, H., Jiang, X., Gao, F., & Zhang, Z. (2014). Absolute height measurement of specular surfaces with modified active fringe reflection photogrammetry. In Interferometry XVII: Advanced Applications (Vol. 9204). [920408] SPIE. https://doi.org/10.1117/12.2060203
Ren, Hongyu ; Jiang, Xiangqian ; Gao, Feng ; Zhang, Zhonghua. / Absolute height measurement of specular surfaces with modified active fringe reflection photogrammetry. Interferometry XVII: Advanced Applications. Vol. 9204 SPIE, 2014.
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Ren, H, Jiang, X, Gao, F & Zhang, Z 2014, Absolute height measurement of specular surfaces with modified active fringe reflection photogrammetry. in Interferometry XVII: Advanced Applications. vol. 9204, 920408, SPIE, Interferometry XVII, San Diego, United States, 18/08/14. https://doi.org/10.1117/12.2060203

Absolute height measurement of specular surfaces with modified active fringe reflection photogrammetry. / Ren, Hongyu; Jiang, Xiangqian; Gao, Feng; Zhang, Zhonghua.

Interferometry XVII: Advanced Applications. Vol. 9204 SPIE, 2014. 920408.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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