Abstract
A novel wavelength measurement scheme, for practical wavelength-dependent optical sensor applications, configured with the use of an additional known wavelength as a self-reference to achieve high measurement accuracy over a range of tens of nanometers is described and presented.
Original language | English |
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Pages (from-to) | 1055-1057 |
Number of pages | 3 |
Journal | IEEE Photonics Technology Letters |
Volume | 8 |
Issue number | 8 |
DOIs | |
Publication status | Published - Aug 1996 |
Externally published | Yes |