Accurate Wavelength Determination in a Wollaston Interferometer for Sensor Applications

X. Q. Jiang; J. Kemp; Y. N. Ning; A. W. Palmer; K. T.V. Grattan

doi:10.1109/68.508736

Accurate Wavelength Determination in a Wollaston Interferometer for Sensor Applications

X. Q. Jiang, J. Kemp, Y. N. Ning, A. W. Palmer, K. T.V. Grattan

University of London City

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

A novel wavelength measurement scheme, for practical wavelength-dependent optical sensor applications, configured with the use of an additional known wavelength as a self-reference to achieve high measurement accuracy over a range of tens of nanometers is described and presented.

Original language	English
Pages (from-to)	1055-1057
Number of pages	3
Journal	IEEE Photonics Technology Letters
Volume	8
Issue number	8
DOIs	https://doi.org/10.1109/68.508736
Publication status	Published - Aug 1996
Externally published	Yes

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@article{573974f2267f40c6bedcf774ffca5ba3,

title = "Accurate Wavelength Determination in a Wollaston Interferometer for Sensor Applications",

abstract = "A novel wavelength measurement scheme, for practical wavelength-dependent optical sensor applications, configured with the use of an additional known wavelength as a self-reference to achieve high measurement accuracy over a range of tens of nanometers is described and presented.",

keywords = "Wavelength measurement, charge coupled devices, Optical interferometry, Optical sensors, interference, Optical modulation, Optical surface waves, Sensor phenomena and characterization, Q measurement, Spectroscopy",

author = "Jiang, \{X. Q.\} and J. Kemp and Ning, \{Y. N.\} and Palmer, \{A. W.\} and Grattan, \{K. T.V.\}",

year = "1996",

month = aug,

doi = "10.1109/68.508736",

language = "English",

volume = "8",

pages = "1055--1057",

journal = "IEEE Photonics Technology Letters",

issn = "1041-1135",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "8",

}

TY - JOUR

T1 - Accurate Wavelength Determination in a Wollaston Interferometer for Sensor Applications

AU - Jiang, X. Q.

AU - Kemp, J.

AU - Ning, Y. N.

AU - Palmer, A. W.

AU - Grattan, K. T.V.

PY - 1996/8

Y1 - 1996/8

N2 - A novel wavelength measurement scheme, for practical wavelength-dependent optical sensor applications, configured with the use of an additional known wavelength as a self-reference to achieve high measurement accuracy over a range of tens of nanometers is described and presented.

AB - A novel wavelength measurement scheme, for practical wavelength-dependent optical sensor applications, configured with the use of an additional known wavelength as a self-reference to achieve high measurement accuracy over a range of tens of nanometers is described and presented.

KW - Wavelength measurement

KW - charge coupled devices

KW - Optical interferometry

KW - Optical sensors

KW - interference

KW - Optical modulation

KW - Optical surface waves

KW - Sensor phenomena and characterization

KW - Q measurement

KW - Spectroscopy

UR - https://www.scopus.com/pages/publications/0030212698

U2 - 10.1109/68.508736

DO - 10.1109/68.508736

M3 - Article

AN - SCOPUS:0030212698

SN - 1041-1135

VL - 8

SP - 1055

EP - 1057

JO - IEEE Photonics Technology Letters

JF - IEEE Photonics Technology Letters

IS - 8

ER -

Accurate Wavelength Determination in a Wollaston Interferometer for Sensor Applications

Abstract

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