Abstract
The needs of modern surface metrology assessment cover not only the extraction of roughness, waviness, but also identification of surface texture or the multi-scalar properties of a surface topography. In answer to this, the newly developing wavelet theory has been introduced into surface characterisation in 1994. Wavelet analysis employs time-frequency windows and offers the relevant time-frequency analysis, as a result, it can divide surface topography into different frequency components, and then study each component with the multi-resolution. This paper provides a survey of the most recent work in the field of surface metrology by using wavelet theory. The major wavelet models used in surface metrology will be introduced and the basic theory, algorithm and the properties of these models will also be discussed.
| Original language | English |
|---|---|
| Title of host publication | Laser Metrology and Machine Performance V |
| Editors | G.N. Peggs |
| Publisher | WIT Press |
| Pages | 247-257 |
| Number of pages | 11 |
| ISBN (Print) | 1853128902 |
| Publication status | Published - 2001 |
| Event | 5th International Conference on Laser Metrology, Machine Tool, CMM and Robot Performance - Birmingham, United Kingdom Duration: 20 Jul 2001 → 20 Jul 2001 Conference number: 5 |
Publication series
| Name | Transactions in Engineering Sciences |
|---|---|
| Publisher | WIT Press |
| Volume | 34 |
| ISSN (Electronic) | 1743-3533 |
Conference
| Conference | 5th International Conference on Laser Metrology, Machine Tool, CMM and Robot Performance |
|---|---|
| Abbreviated title | LAMDAMP 2001 |
| Country/Territory | United Kingdom |
| City | Birmingham |
| Period | 20/07/01 → 20/07/01 |