Advances in surface analysis technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


The needs of modern surface metrology assessment cover not only the extraction of roughness, waviness, but also identification of surface texture or the multi-scalar properties of a surface topography. In answer to this, the newly developing wavelet theory has been introduced into surface characterisation in 1994. Wavelet analysis employs time-frequency windows and offers the relevant time-frequency analysis, as a result, it can divide surface topography into different frequency components, and then study each component with the multi-resolution. This paper provides a survey of the most recent work in the field of surface metrology by using wavelet theory. The major wavelet models used in surface metrology will be introduced and the basic theory, algorithm and the properties of these models will also be discussed.

Original languageEnglish
Title of host publicationLaser Metrology and Machine Performance V
EditorsG.N. Peggs
PublisherWIT Press
Number of pages11
ISBN (Print)1853128902
Publication statusPublished - 2001
Event5th International Conference on Laser Metrology, Machine Tool, CMM and Robot Performance - Birmingham, United Kingdom
Duration: 20 Jul 200120 Jul 2001
Conference number: 5

Publication series

NameTransactions in Engineering Sciences
PublisherWIT Press
ISSN (Electronic)1743-3533


Conference5th International Conference on Laser Metrology, Machine Tool, CMM and Robot Performance
Abbreviated titleLAMDAMP 2001
Country/TerritoryUnited Kingdom


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