Advances in surface analysis technology

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The needs of modern surface metrology assessment cover not only the extraction of roughness, waviness, but also identification of surface texture or the multi-scalar properties of a surface topography. In answer to this, the newly developing wavelet theory has been introduced into surface characterisation in 1994. Wavelet analysis employs time-frequency windows and offers the relevant time-frequency analysis, as a result, it can divide surface topography into different frequency components, and then study each component with the multi-resolution. This paper provides a survey of the most recent work in the field of surface metrology by using wavelet theory. The major wavelet models used in surface metrology will be introduced and the basic theory, algorithm and the properties of these models will also be discussed.

LanguageEnglish
Title of host publicationLaser Metrology and Machine Performance V
EditorsG.N. Peggs
PublisherWIT Press
Pages247-257
Number of pages11
ISBN (Print)1853128902
Publication statusPublished - 2001
Event5th International Conference on Laser Metrology, Machine Tool, CMM and Robot Performance - Birmingham, United Kingdom
Duration: 20 Jul 200120 Jul 2001
Conference number: 5

Publication series

NameTransactions in Engineering Sciences
PublisherWIT Press
Volume34
ISSN (Electronic)1743-3533

Conference

Conference5th International Conference on Laser Metrology, Machine Tool, CMM and Robot Performance
Abbreviated titleLAMDAMP 2001
CountryUnited Kingdom
CityBirmingham
Period20/07/0120/07/01

Fingerprint

Surface analysis
Surface topography
Wavelet analysis
Textures
Surface roughness

Cite this

Jiang, X. Q., & Blunt, L. (2001). Advances in surface analysis technology. In G. N. Peggs (Ed.), Laser Metrology and Machine Performance V (pp. 247-257). (Transactions in Engineering Sciences; Vol. 34). WIT Press.
Jiang, X. Q. ; Blunt, L. / Advances in surface analysis technology. Laser Metrology and Machine Performance V. editor / G.N. Peggs. WIT Press, 2001. pp. 247-257 (Transactions in Engineering Sciences).
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Jiang, XQ & Blunt, L 2001, Advances in surface analysis technology. in GN Peggs (ed.), Laser Metrology and Machine Performance V. Transactions in Engineering Sciences, vol. 34, WIT Press, pp. 247-257, 5th International Conference on Laser Metrology, Machine Tool, CMM and Robot Performance, Birmingham, United Kingdom, 20/07/01.

Advances in surface analysis technology. / Jiang, X. Q.; Blunt, L.

Laser Metrology and Machine Performance V. ed. / G.N. Peggs. WIT Press, 2001. p. 247-257 (Transactions in Engineering Sciences; Vol. 34).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Jiang XQ, Blunt L. Advances in surface analysis technology. In Peggs GN, editor, Laser Metrology and Machine Performance V. WIT Press. 2001. p. 247-257. (Transactions in Engineering Sciences).