Advances in test and measurement of the interface adhesion and bond strengths in coating-substrate systems, emphasising blister and bulk techniques

Xiaomei Chen, Christopher Shaw, Len Gelman, Kenneth T.V. Grattan

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

In this paper, recent advances in the minimum-destructive testing of the adhesion of coating-substrate systems are reviewed, focusing on key techniques such as micro- and nano-scale levels of indentation, scratching, laser-induced wave shock, as well as the blister and buckle approach. Along with adhesion failure tests, the latest and most extensive applications of the adhesion test methods in nano-, micro- and bulk-coating technology and the associated techniques to determine the minimum damage defects left on the coatings are discussed and their use reviewed.
Original languageEnglish
Pages (from-to)387-402
Number of pages16
JournalMeasurement
Volume139
Early online date11 Mar 2019
DOIs
Publication statusPublished - 1 Jun 2019

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