Advances in test and measurement of the interface adhesion and bond strengths in coating-substrate systems, emphasising blister and bulk techniques

Xiaomei Chen; Christopher Shaw; Len Gelman; Kenneth T.V. Grattan

doi:10.1016/j.measurement.2019.03.026

Advances in test and measurement of the interface adhesion and bond strengths in coating-substrate systems, emphasising blister and bulk techniques

Xiaomei Chen, Christopher Shaw, Len Gelman, Kenneth T.V. Grattan

Research output: Contribution to journal › Article › peer-review

55 Citations (Scopus)

Abstract

In this paper, recent advances in the minimum-destructive testing of the adhesion of coating-substrate systems are reviewed, focusing on key techniques such as micro- and nano-scale levels of indentation, scratching, laser-induced wave shock, as well as the blister and buckle approach. Along with adhesion failure tests, the latest and most extensive applications of the adhesion test methods in nano-, micro- and bulk-coating technology and the associated techniques to determine the minimum damage defects left on the coatings are discussed and their use reviewed.

Original language	English
Pages (from-to)	387-402
Number of pages	16
Journal	Measurement
Volume	139
Early online date	11 Mar 2019
DOIs	https://doi.org/10.1016/j.measurement.2019.03.026
Publication status	Published - 1 Jun 2019

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This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

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title = "Advances in test and measurement of the interface adhesion and bond strengths in coating-substrate systems, emphasising blister and bulk techniques",

abstract = "In this paper, recent advances in the minimum-destructive testing of the adhesion of coating-substrate systems are reviewed, focusing on key techniques such as micro- and nano-scale levels of indentation, scratching, laser-induced wave shock, as well as the blister and buckle approach. Along with adhesion failure tests, the latest and most extensive applications of the adhesion test methods in nano-, micro- and bulk-coating technology and the associated techniques to determine the minimum damage defects left on the coatings are discussed and their use reviewed.",

keywords = "Interface adhesion, Bond strength, Coating-substrate system, Minimum-destructive testing",

author = "Xiaomei Chen and Christopher Shaw and Len Gelman and Grattan, \{Kenneth T.V.\}",

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AU - Chen, Xiaomei

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AU - Gelman, Len

AU - Grattan, Kenneth T.V.

PY - 2019/6/1

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AB - In this paper, recent advances in the minimum-destructive testing of the adhesion of coating-substrate systems are reviewed, focusing on key techniques such as micro- and nano-scale levels of indentation, scratching, laser-induced wave shock, as well as the blister and buckle approach. Along with adhesion failure tests, the latest and most extensive applications of the adhesion test methods in nano-, micro- and bulk-coating technology and the associated techniques to determine the minimum damage defects left on the coatings are discussed and their use reviewed.

KW - Interface adhesion

KW - Bond strength

KW - Coating-substrate system

KW - Minimum-destructive testing

U2 - 10.1016/j.measurement.2019.03.026

DO - 10.1016/j.measurement.2019.03.026

M3 - Article

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VL - 139

SP - 387

EP - 402

JO - Measurement

JF - Measurement

ER -

Advances in test and measurement of the interface adhesion and bond strengths in coating-substrate systems, emphasising blister and bulk techniques

Abstract

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