An Approach of Assessment for Ultra-Precision V-Groove Structured Surfaces

X. Jiang, F. Gao, A. Mateboer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Freeform and structured surfaces offer enhanced function properties over component having conventional surface finishes. They are increasingly being used in various applications for optimised functionality such as optical or tribological properties. In the last few decades a great amount of effort has been made in the research and manufacturing of micro and nano scaled freeform and structured surface components. Measurement and assessment of these kinds of surfaces remains a significant "bottle neck" of manufacturing processes and consequently a good deal of research is being carried out to address these problems In this paper, assessments of surface features of two film replicas of diamond turned ultra-high precision V-groove roll (drum) surfaces in the measurement laboratory are presented. Two film replica samples of different parts of the same drum, which differ finish following an interrupted cut are used for the assessments. Various methodologies for obtaining a valid assessment of the surfaces using commercially available surface metrology instruments have been applied, including SEM, stylus instrument and white light interferometry methods. The measurement results are discussed and the best practice for the assessment of precision V groove structured surfaces in a measurement laboratory using commercial instruments is outlined. The future on-line inspections of diamond turned ultra-high precision V-groove drums and other freeform structured surface components are proposed.

LanguageEnglish
Title of host publicationProceedings of the 10th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2010
Publishereuspen
Pages512-516
Number of pages5
Volume1
ISBN (Electronic)9780955308284
Publication statusPublished - 2010
Event10th International Conference of the European Society for Precision Engineering and Nanotechnology - Delft, Netherlands
Duration: 31 May 20104 Jun 2010
Conference number: 10

Conference

Conference10th International Conference of the European Society for Precision Engineering and Nanotechnology
Abbreviated titleEUSPEN 2010
CountryNetherlands
CityDelft
Period31/05/104/06/10

Fingerprint

V grooves
drums
Diamond
replicas
Diamonds
manufacturing
diamonds
bottles
Bottles
Interferometry
metrology
inspection
interferometry
Inspection
methodology
optical properties

Cite this

Jiang, X., Gao, F., & Mateboer, A. (2010). An Approach of Assessment for Ultra-Precision V-Groove Structured Surfaces. In Proceedings of the 10th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2010 (Vol. 1, pp. 512-516). euspen.
Jiang, X. ; Gao, F. ; Mateboer, A. / An Approach of Assessment for Ultra-Precision V-Groove Structured Surfaces. Proceedings of the 10th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2010. Vol. 1 euspen, 2010. pp. 512-516
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Jiang, X, Gao, F & Mateboer, A 2010, An Approach of Assessment for Ultra-Precision V-Groove Structured Surfaces. in Proceedings of the 10th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2010. vol. 1, euspen, pp. 512-516, 10th International Conference of the European Society for Precision Engineering and Nanotechnology, Delft, Netherlands, 31/05/10.

An Approach of Assessment for Ultra-Precision V-Groove Structured Surfaces. / Jiang, X.; Gao, F.; Mateboer, A.

Proceedings of the 10th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2010. Vol. 1 euspen, 2010. p. 512-516.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Jiang X, Gao F, Mateboer A. An Approach of Assessment for Ultra-Precision V-Groove Structured Surfaces. In Proceedings of the 10th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2010. Vol. 1. euspen. 2010. p. 512-516