An in-process, layer wise surface metrology system for a new E-Beam additive manufacturing machine

Liam Blunt, Yue Liu, Zonghua Zhang, Chris Smith, David Knight, Feng Gao, Andrew Townsend, Xiangqian Jiang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Physics & Astronomy

Chemical Compounds

Engineering & Materials Science