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An in situ transmission electron microscopy study of the ion irradiation induced amorphisation of silicon by He and Xe
Philip D. Edmondson, K. J. Abrams, J. A. Hinks, G. Greaves, C. J. Pawley, I. Hanif, S. E. Donnelly
Research output: Contribution to journal › Article › peer-review
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(Scopus)