An Information Model for Surface Metrology

Research output: Contribution to journalConference articlepeer-review

3 Citations (Scopus)


According to ISO standards, the specification and verification of surface texture includes an ordered set of operations. In order to reduce the specification uncertainty, it is of importance to model the significant information related to surface measurement. This paper documents the development of a XML-based information model for surface metrology. Traditional paper-based documents with unstructured data are intergraded into one structured data for surface metrology. Therefore, it limits the specification uncertainty and enhances the reproducibility of surface measurement.

Original languageEnglish
Pages (from-to)251-258
Number of pages8
JournalProcedia CIRP
Publication statusPublished - 2013


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