An Information Model for Surface Metrology

Research output: Contribution to journalConference article

Abstract

According to ISO standards, the specification and verification of surface texture includes an ordered set of operations. In order to reduce the specification uncertainty, it is of importance to model the significant information related to surface measurement. This paper documents the development of a XML-based information model for surface metrology. Traditional paper-based documents with unstructured data are intergraded into one structured data for surface metrology. Therefore, it limits the specification uncertainty and enhances the reproducibility of surface measurement.

LanguageEnglish
Pages251-258
Number of pages8
JournalProcedia CIRP
Volume10
DOIs
Publication statusPublished - 2013

Fingerprint

Surface measurement
Specifications
XML
Textures
Uncertainty

Cite this

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title = "An Information Model for Surface Metrology",
abstract = "According to ISO standards, the specification and verification of surface texture includes an ordered set of operations. In order to reduce the specification uncertainty, it is of importance to model the significant information related to surface measurement. This paper documents the development of a XML-based information model for surface metrology. Traditional paper-based documents with unstructured data are intergraded into one structured data for surface metrology. Therefore, it limits the specification uncertainty and enhances the reproducibility of surface measurement.",
keywords = "Information Model, Specification Uncertainty, Surface Texture, XML",
author = "Tukun Li and Blunt, {Liam A.} and Xiangqian Jiang and Wenhan Zeng",
year = "2013",
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language = "English",
volume = "10",
pages = "251--258",
journal = "Procedia CIRP",
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publisher = "Elsevier",

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An Information Model for Surface Metrology. / Li, Tukun; Blunt, Liam A.; Jiang, Xiangqian; Zeng, Wenhan.

In: Procedia CIRP, Vol. 10, 2013, p. 251-258.

Research output: Contribution to journalConference article

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AU - Blunt, Liam A.

AU - Jiang, Xiangqian

AU - Zeng, Wenhan

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AB - According to ISO standards, the specification and verification of surface texture includes an ordered set of operations. In order to reduce the specification uncertainty, it is of importance to model the significant information related to surface measurement. This paper documents the development of a XML-based information model for surface metrology. Traditional paper-based documents with unstructured data are intergraded into one structured data for surface metrology. Therefore, it limits the specification uncertainty and enhances the reproducibility of surface measurement.

KW - Information Model

KW - Specification Uncertainty

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KW - XML

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T2 - Procedia CIRP

JF - Procedia CIRP

SN - 2212-8271

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