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NANOMEND: Nanoscale Defect Detection, Cleaning and Repair for Large Area Substrates
Blunt, L. (PI)
1/01/12 → 31/12/15
Project: Research
An integrated opto-mechanical measurement system for in-process defect measurement on a roll-to-roll process
H. Muhamedsalih, L. Blunt, H. Martin, Ivo Hamersma, Mohamed Elrawemi, F. Gao
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
5
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Citations
(Scopus)