In this study, plasma-enhanced pulsed laser deposition (PE-PLD), which is a novel variant of pulsed laser deposition that combines laser ablation of metal targets with an electrically-produced oxygen plasma background, has been used for the fabrication of ZnO and Cu2O thin films. Samples prepared using the PE-PLD process, with the aim of generating desirable properties for a range of electrical and optical applications, have been analysed using medium energy ion scattering. Using a 100 keV He+ ion beam, high resolution depth profiling of the films was performed with an analysis of the stoichiometry and interface abruptness of these novel materials. It was found that the PE-PLD process can create stoichiometric thin films, the uniformity of which can be controlled by varying the power of the inductively coupled plasma. This technique showed a high deposition rate of ∼0.1 nm s−1.
|Number of pages||5|
|Journal||Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms|
|Early online date||7 Jul 2018|
|Publication status||Published - 1 Jul 2019|
Rossall, A., Van Den Berg, J., Meehan, D., Rajendiran, S., & Wagenaars, E. (2019). Analysis of plasma enhanced pulsed laser deposition of transition metal oxide thin films using medium energy ion scattering. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 450, 274-278. https://doi.org/10.1016/j.nimb.2018.06.023