Application of Clustering Filter for Noise and Outlier Suppression in Optical Measurement of Structured Surfaces

Keyphrases

• Structured Surface 100%
• Noise Suppression 100%
• Optical Measurement 100%
• Outlier Suppression 100%
• Surface Topography 66%
• Surface Characterization 66%
• Surface Data 33%
• Filter Method 33%
• Non-destructive 33%
• Detrimental Effects 33%
• Iterative Process 33%
• Surface Measurement 33%
• Surface Sampling 33%
• Micro-nano 33%
• Tactile Sensor 33%
• White Light Interferometer 33%
• Interferometer 33%
• Optical Techniques 33%
• Accurate Evaluation 33%
• Functional Geometry 33%
• Noise Measurement 33%
• Structured Features 33%
• Edge Preserving 33%
• Local Functionals 33%
• Point Clustering 33%
• Measurement Solutions 33%

Engineering

• Structured Surface 100%
• Surface Topography 66%
• Sample Surface 33%
• Nanoscale 33%
• Optical Sensors 33%
• Measurement Noise 33%
• Iterative Process 33%
• Areal Profile 33%