Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study

Joven Lim; Eric Prestat; Anna Carlsson; Graeme Greaves; Stephen Donnelly; Quentin Ramasse; M. Grace Burke

doi:10.1017/S1431927620014506

Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study

Joven Lim, Eric Prestat, Anna Carlsson, Graeme Greaves, Stephen Donnelly, Quentin Ramasse, M. Grace Burke

Research output: Contribution to journal › Meeting Abstract › peer-review

Original language	English
Pages (from-to)	394-395
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	26
Issue number	S2
Early online date	30 Jul 2020
DOIs	https://doi.org/10.1017/S1431927620014506
Publication status	Published - 1 Aug 2020
Event	Microscopy & Microanalysis 2020 Meeting - Online Duration: 4 Aug 2020 → 7 Aug 2020 https://www.microscopy.org/MandM/2020/

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@article{e3e67ee0de5b4bedb2718c2b73bbcb31,

title = "Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study",

keywords = "Electron Microscope, Pixelated STEM Detector, Radiation Damage",

author = "Joven Lim and Eric Prestat and Anna Carlsson and Graeme Greaves and Stephen Donnelly and Quentin Ramasse and {Grace Burke}, M.",

year = "2020",

month = aug,

day = "1",

doi = "10.1017/S1431927620014506",

language = "English",

volume = "26",

pages = "394--395",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "S2",

note = "Microscopy & Microanalysis 2020 Meeting ; Conference date: 04-08-2020 Through 07-08-2020",

url = "https://www.microscopy.org/MandM/2020/",

}

TY - JOUR

T1 - Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study

AU - Lim, Joven

AU - Prestat, Eric

AU - Carlsson, Anna

AU - Greaves, Graeme

AU - Donnelly, Stephen

AU - Ramasse, Quentin

AU - Grace Burke, M.

PY - 2020/8/1

Y1 - 2020/8/1

KW - Electron Microscope

KW - Pixelated STEM Detector

KW - Radiation Damage

UR - http://www.scopus.com/inward/record.url?scp=85094682220&partnerID=8YFLogxK

U2 - 10.1017/S1431927620014506

DO - 10.1017/S1431927620014506

M3 - Meeting Abstract

VL - 26

SP - 394

EP - 395

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - S2

T2 - Microscopy & Microanalysis 2020 Meeting

Y2 - 4 August 2020 through 7 August 2020

ER -

Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study

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