Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study

Joven Lim, Eric Prestat, Anna Carlsson, Graeme Greaves, Stephen Donnelly, Quentin Ramasse, M. Grace Burke

Research output: Contribution to journalMeeting Abstractpeer-review

Original languageEnglish
Pages (from-to)394-395
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberS2
Early online date30 Jul 2020
Publication statusPublished - 1 Aug 2020
EventMicroscopy & Microanalysis 2020 Meeting - Online
Duration: 4 Aug 20207 Aug 2020

Cite this