@article{e3e67ee0de5b4bedb2718c2b73bbcb31,
title = "Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study",
keywords = "Electron Microscope, Pixelated STEM Detector, Radiation Damage",
author = "Joven Lim and Eric Prestat and Anna Carlsson and Graeme Greaves and Stephen Donnelly and Quentin Ramasse and \{Grace Burke\}, M.",
year = "2020",
month = aug,
day = "1",
doi = "10.1017/S1431927620014506",
language = "English",
volume = "26",
pages = "394--395",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Oxford University Press",
number = "S2",
note = "Microscopy \& Microanalysis 2020 Meeting ; Conference date: 04-08-2020 Through 07-08-2020",
url = "https://www.microscopy.org/MandM/2020/",
}