Application of the Lifting Wavelet to Rough Surfaces

X. Q. Jiang, L. Blunt, K. J. Stout

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

This paper proposes a lifting wavelet model for enhancement of accuracy of surface roughness characterisation. In this work, the theory and fast algorithm of the lifting wavelet are briefly introduced and a lifting wavelet model for extraction of roughness of surfaces has been developed. The rough surface recovered has good refinement accuracy in contrast to the least squares polynomial fitting. Applications are conducted by using a series of typical surfaces, planes and curves, measured by contact (stylus) and non-contact (phase-shifting interferometry) instruments, to demonstrate the feasibility and applicability of using the lifting wavelet model in the analysis of these surfaces.

Original languageEnglish
Pages (from-to)83-89
Number of pages7
JournalPrecision Engineering
Volume25
Issue number2
DOIs
Publication statusPublished - 1 Apr 2001

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