Activities per year
Abstract
The overall quality of a machined component has an important association with the quality of its surface finish. To obtain adequate data for the surface metrology of machined components, areal scanners are often preferred over stylus based profile scanners due to their ability to acquire surface data over a relatively large area. To further improve efficiency, there is a desire to perform on-machine measurement, and recently, high-resolution areal surface scanners have been integrated as an on-machine measurement device. Due to the limited areal coverage, these scanners can require multiple scans to capture data from surfaces produced on machine tools which requires a sufficient amount of time to complete a full surface scan. In addition, since these scanners are very sensitive, scanning delays often cause areal scanners to capture data contaminated with noise which may arise from within the machining environment such as axes vibrations, temperature effects, dust, etc. These factors mean such instruments are typically used in metrology laboratories. This paper presents a new methodology referred to as multidirectional scanning (MDS) which is a technique that exploits characteristics of a 2D laser line scanner (profilometer). The device is used in two directions to scan the overall component surface ensuring the coverage of a wider surface area compared to typical areal scanners. Since the scanner is robust and integrated onto a machine tool, controlled axes feed rates in the orthogonal directions ensure high spatial resolution which in turn helps to identify and reduce the noise levels in the data. This methodology has been validated to be both accurate and rapid to scan the component surface, reducing the cost associated with machine downtime and also having a wider coverage of 6x6 mm2 for a single scan, compared to 1 mm2 for most conventional areal surface measurement instruments having comparable spatial and vertical resolution.
Original language | English |
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Title of host publication | Laser metrology and machine performance XII |
Subtitle of host publication | Papers presented at the Twelfth International Conference and Exhibition on Laser Metrology, Coordinate Measuring Machine and Machine Tool Performance (LAMDAMAP 2017) |
Editors | Liam Blunt, Wolfgang Knapp |
Place of Publication | Bedfordshire |
Publisher | euspen |
Pages | 175-184 |
Number of pages | 10 |
ISBN (Print) | 9780956679093 |
Publication status | Published - 15 Mar 2017 |
Event | 12th International Conference and Exhibition on Laser Metrology, Coordinate Measuring Machine and Machine Tool Performance - Renishaw Innovation Centre, Wotton-under-Edge, United Kingdom Duration: 15 Mar 2017 → 16 Mar 2017 Conference number: 12 http://www.euspen.eu/events/lamdamap-12th-international-conference-exhibition/ (Link to Conference Details ) https://www.euspen.eu/our-events/lamdamap-programme/ (Link to Event Details) https://www.euspen.eu/wp-content/uploads/2017/03/Programme-delegates.pdf (Programme) |
Conference
Conference | 12th International Conference and Exhibition on Laser Metrology, Coordinate Measuring Machine and Machine Tool Performance |
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Abbreviated title | LAMDAMAP 2017 |
Country/Territory | United Kingdom |
City | Wotton-under-Edge |
Period | 15/03/17 → 16/03/17 |
Internet address |
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Dive into the research topics of 'Areal surface measurement using multidirectional laser line scanning'. Together they form a unique fingerprint.Profiles
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Naeem Mian
- Department of Engineering - Subject Area Leader (Mechanical and Automotive Engineering)
- School of Computing and Engineering
- Centre for Precision Technologies - Member
- Centre for Thermofluids, Energy Systems and High-Performance Computing - Associate Member
Person: Academic
Activities
- 1 Oral presentation
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Areal surface measurement using multidirectional laser line scanning
Kwame Akowua (Speaker), Simon Fletcher (Contributor to Paper or Presentation), Andrew Longstaff (Contributor to Paper or Presentation) & Naeem Mian (Contributor to Paper or Presentation)
16 Mar 2017Activity: Talk or presentation types › Oral presentation