Original language | English |
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Pages (from-to) | 1736-1737 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 20 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1 Aug 2014 |
Atom-by-atom STEM investigation of defect engineering in graphene
Quentin Mathieu Ramasse, D. M. Kepapstoglou, F. S. Hage, T. Susi, J. Kotakoski, C. Mangler, P. Ayala, J. Meyer, J. A. Hinks, S. Donnelly, R. Zan, C. T. Pan, S. J. Haigh, U. Bangert
Research output: Contribution to journal › Article › peer-review
2
Citations
(Scopus)