Atom-by-atom STEM investigation of defect engineering in graphene

Quentin Mathieu Ramasse, D. M. Kepapstoglou, F. S. Hage, T. Susi, J. Kotakoski, C. Mangler, P. Ayala, J. Meyer, J. A. Hinks, S. Donnelly, R. Zan, C. T. Pan, S. J. Haigh, U. Bangert

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)1736-1737
Number of pages2
JournalMicroscopy and Microanalysis
Issue number3
Publication statusPublished - 1 Aug 2014

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