Atom-by-Atom STEM Investigation of Defect Engineering in Graphene

Quentin Mathieu Ramasse; D. M. Kepapstoglou; F. S. Hage; T. Susi; J. Kotakoski; C. Mangler; P. Ayala; J. Meyer; J. A. Hinks; S. Donnelly; R. Zan; C. T. Pan; S. J. Haigh; U. Bangert

doi:10.1017/S1431927614010411

Atom-by-Atom STEM Investigation of Defect Engineering in Graphene

Quentin Mathieu Ramasse, D. M. Kepapstoglou, F. S. Hage, T. Susi, J. Kotakoski, C. Mangler, P. Ayala, J. Meyer, J. A. Hinks, S. Donnelly, R. Zan, C. T. Pan, S. J. Haigh, U. Bangert

Research output: Contribution to journal › Meeting Abstract › peer-review

2 Citations (Scopus)

Original language	English
Pages (from-to)	1736-1737
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	S3
DOIs	https://doi.org/10.1017/S1431927614010411
Publication status	Published - 1 Aug 2014
Event	Microscopy and Microanalysis Meeting - Hartford, United States Duration: 3 Aug 2014 → 7 Aug 2014

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@article{57a05915220f4025a8f3c1997e085e0f,

title = "Atom-by-Atom STEM Investigation of Defect Engineering in Graphene",

keywords = "graphene, STEM, atoms",

author = "Ramasse, {Quentin Mathieu} and Kepapstoglou, {D. M.} and Hage, {F. S.} and T. Susi and J. Kotakoski and C. Mangler and P. Ayala and J. Meyer and Hinks, {J. A.} and S. Donnelly and R. Zan and Pan, {C. T.} and Haigh, {S. J.} and U. Bangert",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614010411",

language = "English",

volume = "20",

pages = "1736--1737",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "S3",

note = "Microscopy and Microanalysis Meeting, M & M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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TY - JOUR

T1 - Atom-by-Atom STEM Investigation of Defect Engineering in Graphene

AU - Ramasse, Quentin Mathieu

AU - Kepapstoglou, D. M.

AU - Hage, F. S.

AU - Susi, T.

AU - Kotakoski, J.

AU - Mangler, C.

AU - Ayala, P.

AU - Meyer, J.

AU - Hinks, J. A.

AU - Donnelly, S.

AU - Zan, R.

AU - Pan, C. T.

AU - Haigh, S. J.

AU - Bangert, U.

PY - 2014/8/1

Y1 - 2014/8/1

KW - graphene

KW - STEM

KW - atoms

UR - http://www.scopus.com/inward/record.url?scp=84927929832&partnerID=8YFLogxK

U2 - 10.1017/S1431927614010411

DO - 10.1017/S1431927614010411

M3 - Meeting Abstract

AN - SCOPUS:84927929832

VL - 20

SP - 1736

EP - 1737

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - S3

T2 - Microscopy and Microanalysis Meeting

Y2 - 3 August 2014 through 7 August 2014

ER -

Atom-by-Atom STEM Investigation of Defect Engineering in Graphene

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