Atom-by-atom STEM investigation of defect engineering in graphene

Quentin Mathieu Ramasse, D. M. Kepapstoglou, F. S. Hage, T. Susi, J. Kotakoski, C. Mangler, P. Ayala, J. Meyer, J. A. Hinks, S. Donnelly, R. Zan, C. T. Pan, S. J. Haigh, U. Bangert

Research output: Contribution to journalArticle

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)1736-1737
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
Publication statusPublished - 1 Aug 2014

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