Atom-by-atom STEM investigation of defect engineering in graphene

Quentin Mathieu Ramasse; D. M. Kepapstoglou; F. S. Hage; T. Susi; J. Kotakoski; C. Mangler; P. Ayala; J. Meyer; J. A. Hinks; S. Donnelly; R. Zan; C. T. Pan; S. J. Haigh; U. Bangert

doi:10.1017/S1431927614010411

Atom-by-atom STEM investigation of defect engineering in graphene

Quentin Mathieu Ramasse, D. M. Kepapstoglou, F. S. Hage, T. Susi, J. Kotakoski, C. Mangler, P. Ayala, J. Meyer, J. A. Hinks, S. Donnelly, R. Zan, C. T. Pan, S. J. Haigh, U. Bangert

Research output: Contribution to journal › Article

2 Citations (Scopus)

Original language	English
Pages (from-to)	1736-1737
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614010411
Publication status	Published - 1 Aug 2014

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10.1017/S1431927614010411Licence: Other

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Ramasse, Q. M., Kepapstoglou, D. M., Hage, F. S., Susi, T., Kotakoski, J., Mangler, C., ... Bangert, U. (2014). Atom-by-atom STEM investigation of defect engineering in graphene. Microscopy and Microanalysis, 20(3), 1736-1737. https://doi.org/10.1017/S1431927614010411

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Atom-by-atom STEM investigation of defect engineering in graphene. / Ramasse, Quentin Mathieu; Kepapstoglou, D. M.; Hage, F. S.; Susi, T.; Kotakoski, J.; Mangler, C.; Ayala, P.; Meyer, J.; Hinks, J. A.; Donnelly, S.; Zan, R.; Pan, C. T.; Haigh, S. J.; Bangert, U.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.08.2014, p. 1736-1737.

Research output: Contribution to journal › Article

TY - JOUR

T1 - Atom-by-atom STEM investigation of defect engineering in graphene

AU - Ramasse, Quentin Mathieu

AU - Kepapstoglou, D. M.

AU - Hage, F. S.

AU - Susi, T.

AU - Kotakoski, J.

AU - Mangler, C.

AU - Ayala, P.

AU - Meyer, J.

AU - Hinks, J. A.

AU - Donnelly, S.

AU - Zan, R.

AU - Pan, C. T.

AU - Haigh, S. J.

AU - Bangert, U.

PY - 2014/8/1

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JO - Microscopy and Microanalysis

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