Atom-by-atom STEM investigation of defect engineering in graphene

Quentin Mathieu Ramasse; D. M. Kepapstoglou; F. S. Hage; T. Susi; J. Kotakoski; C. Mangler; P. Ayala; J. Meyer; J. A. Hinks; S. Donnelly; R. Zan; C. T. Pan; S. J. Haigh; U. Bangert

doi:10.1017/S1431927614010411

Atom-by-atom STEM investigation of defect engineering in graphene

Quentin Mathieu Ramasse, D. M. Kepapstoglou, F. S. Hage, T. Susi, J. Kotakoski, C. Mangler, P. Ayala, J. Meyer, J. A. Hinks, S. Donnelly, R. Zan, C. T. Pan, S. J. Haigh, U. Bangert

Research output: Contribution to journal › Article

2 Citations (Scopus)

Original language	English
Pages (from-to)	1736-1737
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614010411
Publication status	Published - 1 Aug 2014

Access to Document

10.1017/S1431927614010411Licence: Other

Link to publication in Scopus

Cite this

Ramasse, Q. M., Kepapstoglou, D. M., Hage, F. S., Susi, T., Kotakoski, J., Mangler, C., Ayala, P., Meyer, J., Hinks, J. A., Donnelly, S., Zan, R., Pan, C. T., Haigh, S. J., & Bangert, U. (2014). Atom-by-atom STEM investigation of defect engineering in graphene. Microscopy and Microanalysis, 20(3), 1736-1737. https://doi.org/10.1017/S1431927614010411

@article{57a05915220f4025a8f3c1997e085e0f,

title = "Atom-by-atom STEM investigation of defect engineering in graphene",

author = "Ramasse, {Quentin Mathieu} and Kepapstoglou, {D. M.} and Hage, {F. S.} and T. Susi and J. Kotakoski and C. Mangler and P. Ayala and J. Meyer and Hinks, {J. A.} and S. Donnelly and R. Zan and Pan, {C. T.} and Haigh, {S. J.} and U. Bangert",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614010411",

language = "English",

volume = "20",

pages = "1736--1737",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "3",

}

Atom-by-atom STEM investigation of defect engineering in graphene. / Ramasse, Quentin Mathieu; Kepapstoglou, D. M.; Hage, F. S.; Susi, T.; Kotakoski, J.; Mangler, C.; Ayala, P.; Meyer, J.; Hinks, J. A.; Donnelly, S.; Zan, R.; Pan, C. T.; Haigh, S. J.; Bangert, U.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.08.2014, p. 1736-1737.

Research output: Contribution to journal › Article

TY - JOUR

T1 - Atom-by-atom STEM investigation of defect engineering in graphene

AU - Ramasse, Quentin Mathieu

AU - Kepapstoglou, D. M.

AU - Hage, F. S.

AU - Susi, T.

AU - Kotakoski, J.

AU - Mangler, C.

AU - Ayala, P.

AU - Meyer, J.

AU - Hinks, J. A.

AU - Donnelly, S.

AU - Zan, R.

AU - Pan, C. T.

AU - Haigh, S. J.

AU - Bangert, U.

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84927929832&partnerID=8YFLogxK

U2 - 10.1017/S1431927614010411

DO - 10.1017/S1431927614010411

M3 - Article

AN - SCOPUS:84927929832

VL - 20

SP - 1736

EP - 1737

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - 3

ER -