Atom-by-Atom STEM Investigation of Defect Engineering in Graphene

Quentin Mathieu Ramasse, D. M. Kepapstoglou, F. S. Hage, T. Susi, J. Kotakoski, C. Mangler, P. Ayala, J. Meyer, J. A. Hinks, S. Donnelly, R. Zan, C. T. Pan, S. J. Haigh, U. Bangert

Research output: Contribution to journalMeeting Abstractpeer-review

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)1736-1737
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberS3
Publication statusPublished - 1 Aug 2014
EventMicroscopy and Microanalysis Meeting - Hartford, United States
Duration: 3 Aug 20147 Aug 2014

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