Atom (fast atom bombardment) compared to ion-induced static secondary ion mass spectrometry: Evidence for charge-induced damage in insulators

A. Brown, J. A. van den Berg, J. C. Vickerman

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

A comparison of the secondary ion mass spectra obtained and the surface damage caused by ion and atom bombardment of polystyrene and niobium pentoxide shows that ion bombardment causes significantly more disruption of the surface structure of low conductivity materials than does atom bombardment.

LanguageEnglish
Pages1684-1686
Number of pages3
JournalJournal of the Chemical Society - Series Chemical Communications
Issue number24
DOIs
Publication statusPublished - 15 Dec 1984
Externally publishedYes

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Secondary Ion Mass Spectrometry
Secondary ion mass spectrometry
Ions
Atoms
Polystyrenes
Ion bombardment
Niobium
Surface structure
niobium pentoxide

Cite this

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title = "Atom (fast atom bombardment) compared to ion-induced static secondary ion mass spectrometry: Evidence for charge-induced damage in insulators",
abstract = "A comparison of the secondary ion mass spectra obtained and the surface damage caused by ion and atom bombardment of polystyrene and niobium pentoxide shows that ion bombardment causes significantly more disruption of the surface structure of low conductivity materials than does atom bombardment.",
author = "A. Brown and {van den Berg}, {J. A.} and Vickerman, {J. C.}",
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