Atom (fast atom bombardment) compared to ion-induced static secondary ion mass spectrometry: Evidence for charge-induced damage in insulators

A. Brown; J. A. van den Berg; J. C. Vickerman

doi:10.1039/C39840001684

Atom (fast atom bombardment) compared to ion-induced static secondary ion mass spectrometry: Evidence for charge-induced damage in insulators

A. Brown, J. A. van den Berg, J. C. Vickerman

University of Manchester Institute of Science and Technology

Research output: Contribution to journal › Article › peer-review

14 Citations (Scopus)

Abstract

A comparison of the secondary ion mass spectra obtained and the surface damage caused by ion and atom bombardment of polystyrene and niobium pentoxide shows that ion bombardment causes significantly more disruption of the surface structure of low conductivity materials than does atom bombardment.

Original language	English
Pages (from-to)	1684-1686
Number of pages	3
Journal	Journal of the Chemical Society - Series Chemical Communications
Issue number	24
DOIs	https://doi.org/10.1039/C39840001684
Publication status	Published - 15 Dec 1984
Externally published	Yes

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@article{d718a25c71c14795ab3ecfc12c2bd3db,

title = "Atom (fast atom bombardment) compared to ion-induced static secondary ion mass spectrometry: Evidence for charge-induced damage in insulators",

abstract = "A comparison of the secondary ion mass spectra obtained and the surface damage caused by ion and atom bombardment of polystyrene and niobium pentoxide shows that ion bombardment causes significantly more disruption of the surface structure of low conductivity materials than does atom bombardment.",

author = "A. Brown and \{van den Berg\}, \{J. A.\} and Vickerman, \{J. C.\}",

year = "1984",

month = dec,

day = "15",

doi = "10.1039/C39840001684",

language = "English",

pages = "1684--1686",

journal = "Journal of the Chemical Society - Series Chemical Communications",

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publisher = "Royal Society of Chemistry",

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T1 - Atom (fast atom bombardment) compared to ion-induced static secondary ion mass spectrometry

T2 - Evidence for charge-induced damage in insulators

AU - Brown, A.

AU - van den Berg, J. A.

AU - Vickerman, J. C.

PY - 1984/12/15

Y1 - 1984/12/15

N2 - A comparison of the secondary ion mass spectra obtained and the surface damage caused by ion and atom bombardment of polystyrene and niobium pentoxide shows that ion bombardment causes significantly more disruption of the surface structure of low conductivity materials than does atom bombardment.

AB - A comparison of the secondary ion mass spectra obtained and the surface damage caused by ion and atom bombardment of polystyrene and niobium pentoxide shows that ion bombardment causes significantly more disruption of the surface structure of low conductivity materials than does atom bombardment.

UR - https://www.scopus.com/pages/publications/37049092194

U2 - 10.1039/C39840001684

DO - 10.1039/C39840001684

M3 - Article

AN - SCOPUS:37049092194

SN - 0022-4936

SP - 1684

EP - 1686

JO - Journal of the Chemical Society - Series Chemical Communications

JF - Journal of the Chemical Society - Series Chemical Communications

IS - 24

ER -

Atom (fast atom bombardment) compared to ion-induced static secondary ion mass spectrometry: Evidence for charge-induced damage in insulators

Abstract

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