Atomic force microscopy: Pinning down the thickness of twin walls

E. K.H. Salje, W. T. Lee

Research output: Contribution to journalShort surveypeer-review

12 Citations (Scopus)

Abstract

The properties and the interaction of the twin walls that influence ferroelectrics and superconducting materials is discussed. The superconducting ferroelectrics and ferroelastic crystals were found to exhibit domain structures and the twin walls are known to have physical and chemical properties. It is also found that the thickness of the wall domain is determined by balancing a bulk energy and a bending energy and measurements of the parameters controlling both these energies is required. The Atomic Force Microscopes (AFM) are used for the method that allows the surface topography of a crystal to be imaged. The results show that wall widths are checked by the estimation of diffraction measurements.

Original languageEnglish
Pages (from-to)425-426
Number of pages2
JournalNature Materials
Volume3
Issue number7
DOIs
Publication statusPublished - 1 Jul 2004
Externally publishedYes

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