Atomistic investigation of the wear of nanoscale diamond cutting tools shaped by focused ion beam

Zhen Tong, Xiangqian Jiang, Qingshun Bai, Liam Blunt, Xichun Luo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In recent years, micro/nanoscale diamond cutting tools shaped by focused ion beam (FIB) has been developed to the deterministic fabrication of micro/nano-structures owing to its unprecedented merits of high throughput, one-step, and highly flexible precision capabilities. However, the exposure of a diamond tool to FIB will result in the implantation of ion source material and the irradiation damage in cutting edges, and thus affect the tool life. In this work, molecular dynamics (MD) simulation has been carried out to study the effects of FIB induced damage on the wear resistance of nanoscale multi- Tip diamond tool under different cutting conditions. A novel nanoscale multi- Tip diamond tool model was built with the implanted Ga+ and amorphous damaged layer around tool tips. A damage free tool model with the same tool geometry was built as a reference. The wear resistance of the cutting tool was characterized by the total number of defect atoms formed during nanometric cutting of single crystal copper. The results show that the FIB irradiation induced doping and defects significantly degrade the wear resistance of the diamond tool. For the damage free tool cutting, the sp2 bonded carbon atoms were formed and accumulated on the surface layers. However, the sp2 bonded carbon atoms were found both on the surface and the deep inside of tool when using the tool of predefined defects. The implanted gallium atoms were found to move to the tool surface and left vacuums inside diamond tool tip, which would further degrade the wear resistance of the tool. Moreover, the variation of the sp2-bonded carbon atoms against the depth of cut and the cutting speed has been further analysed. The research findings from this study inform the in-depth understanding of tool wear of FIB shaped multi- Tip diamond tool observed in previous nanometric cutting experiment.

Original languageEnglish
Title of host publicationProceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016
Publishereuspen
ISBN (Electronic)9780956679086
Publication statusPublished - 2016
Event16th International Conference of the European Society for Precision Engineering and Nanotechnology - East Midlands Conference Centre, Nottingham, United Kingdom
Duration: 30 May 20163 Jun 2016
Conference number: 16
https://www.euspen.eu/events/16th-international-conference-exhibition/ (Link to Conference Website)

Conference

Conference16th International Conference of the European Society for Precision Engineering and Nanotechnology
Abbreviated titleEUSPEN 2016
CountryUnited Kingdom
CityNottingham
Period30/05/163/06/16
OtherThis event offers the possibility to see latest advances in traditional precision engineering fields such as metrology, ultra precision machining, additive and replication processes, precision mechatronic systems & control and precision cutting processes.
Internet address

Fingerprint

Diamond cutting tools
Focused ion beams
diamonds
ion beams
Wear of materials
Diamond
Diamonds
Wear resistance
wear resistance
Atoms
Carbon
damage
Cutting tools
Defects
atoms
Irradiation
carbon
defects
Gallium
Ion sources

Cite this

Tong, Z., Jiang, X., Bai, Q., Blunt, L., & Luo, X. (2016). Atomistic investigation of the wear of nanoscale diamond cutting tools shaped by focused ion beam. In Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016 euspen.
Tong, Zhen ; Jiang, Xiangqian ; Bai, Qingshun ; Blunt, Liam ; Luo, Xichun. / Atomistic investigation of the wear of nanoscale diamond cutting tools shaped by focused ion beam. Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016. euspen, 2016.
@inproceedings{6ccc9d86ec9744cbb82d1d64b7d0392e,
title = "Atomistic investigation of the wear of nanoscale diamond cutting tools shaped by focused ion beam",
abstract = "In recent years, micro/nanoscale diamond cutting tools shaped by focused ion beam (FIB) has been developed to the deterministic fabrication of micro/nano-structures owing to its unprecedented merits of high throughput, one-step, and highly flexible precision capabilities. However, the exposure of a diamond tool to FIB will result in the implantation of ion source material and the irradiation damage in cutting edges, and thus affect the tool life. In this work, molecular dynamics (MD) simulation has been carried out to study the effects of FIB induced damage on the wear resistance of nanoscale multi- Tip diamond tool under different cutting conditions. A novel nanoscale multi- Tip diamond tool model was built with the implanted Ga+ and amorphous damaged layer around tool tips. A damage free tool model with the same tool geometry was built as a reference. The wear resistance of the cutting tool was characterized by the total number of defect atoms formed during nanometric cutting of single crystal copper. The results show that the FIB irradiation induced doping and defects significantly degrade the wear resistance of the diamond tool. For the damage free tool cutting, the sp2 bonded carbon atoms were formed and accumulated on the surface layers. However, the sp2 bonded carbon atoms were found both on the surface and the deep inside of tool when using the tool of predefined defects. The implanted gallium atoms were found to move to the tool surface and left vacuums inside diamond tool tip, which would further degrade the wear resistance of the tool. Moreover, the variation of the sp2-bonded carbon atoms against the depth of cut and the cutting speed has been further analysed. The research findings from this study inform the in-depth understanding of tool wear of FIB shaped multi- Tip diamond tool observed in previous nanometric cutting experiment.",
keywords = "Diamond cutting, Focused ion beam, Irradiation damage, Nanometric cutting, Tool wear",
author = "Zhen Tong and Xiangqian Jiang and Qingshun Bai and Liam Blunt and Xichun Luo",
year = "2016",
language = "English",
booktitle = "Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016",
publisher = "euspen",

}

Tong, Z, Jiang, X, Bai, Q, Blunt, L & Luo, X 2016, Atomistic investigation of the wear of nanoscale diamond cutting tools shaped by focused ion beam. in Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016. euspen, 16th International Conference of the European Society for Precision Engineering and Nanotechnology, Nottingham, United Kingdom, 30/05/16.

Atomistic investigation of the wear of nanoscale diamond cutting tools shaped by focused ion beam. / Tong, Zhen; Jiang, Xiangqian; Bai, Qingshun; Blunt, Liam; Luo, Xichun.

Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016. euspen, 2016.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Atomistic investigation of the wear of nanoscale diamond cutting tools shaped by focused ion beam

AU - Tong, Zhen

AU - Jiang, Xiangqian

AU - Bai, Qingshun

AU - Blunt, Liam

AU - Luo, Xichun

PY - 2016

Y1 - 2016

N2 - In recent years, micro/nanoscale diamond cutting tools shaped by focused ion beam (FIB) has been developed to the deterministic fabrication of micro/nano-structures owing to its unprecedented merits of high throughput, one-step, and highly flexible precision capabilities. However, the exposure of a diamond tool to FIB will result in the implantation of ion source material and the irradiation damage in cutting edges, and thus affect the tool life. In this work, molecular dynamics (MD) simulation has been carried out to study the effects of FIB induced damage on the wear resistance of nanoscale multi- Tip diamond tool under different cutting conditions. A novel nanoscale multi- Tip diamond tool model was built with the implanted Ga+ and amorphous damaged layer around tool tips. A damage free tool model with the same tool geometry was built as a reference. The wear resistance of the cutting tool was characterized by the total number of defect atoms formed during nanometric cutting of single crystal copper. The results show that the FIB irradiation induced doping and defects significantly degrade the wear resistance of the diamond tool. For the damage free tool cutting, the sp2 bonded carbon atoms were formed and accumulated on the surface layers. However, the sp2 bonded carbon atoms were found both on the surface and the deep inside of tool when using the tool of predefined defects. The implanted gallium atoms were found to move to the tool surface and left vacuums inside diamond tool tip, which would further degrade the wear resistance of the tool. Moreover, the variation of the sp2-bonded carbon atoms against the depth of cut and the cutting speed has been further analysed. The research findings from this study inform the in-depth understanding of tool wear of FIB shaped multi- Tip diamond tool observed in previous nanometric cutting experiment.

AB - In recent years, micro/nanoscale diamond cutting tools shaped by focused ion beam (FIB) has been developed to the deterministic fabrication of micro/nano-structures owing to its unprecedented merits of high throughput, one-step, and highly flexible precision capabilities. However, the exposure of a diamond tool to FIB will result in the implantation of ion source material and the irradiation damage in cutting edges, and thus affect the tool life. In this work, molecular dynamics (MD) simulation has been carried out to study the effects of FIB induced damage on the wear resistance of nanoscale multi- Tip diamond tool under different cutting conditions. A novel nanoscale multi- Tip diamond tool model was built with the implanted Ga+ and amorphous damaged layer around tool tips. A damage free tool model with the same tool geometry was built as a reference. The wear resistance of the cutting tool was characterized by the total number of defect atoms formed during nanometric cutting of single crystal copper. The results show that the FIB irradiation induced doping and defects significantly degrade the wear resistance of the diamond tool. For the damage free tool cutting, the sp2 bonded carbon atoms were formed and accumulated on the surface layers. However, the sp2 bonded carbon atoms were found both on the surface and the deep inside of tool when using the tool of predefined defects. The implanted gallium atoms were found to move to the tool surface and left vacuums inside diamond tool tip, which would further degrade the wear resistance of the tool. Moreover, the variation of the sp2-bonded carbon atoms against the depth of cut and the cutting speed has been further analysed. The research findings from this study inform the in-depth understanding of tool wear of FIB shaped multi- Tip diamond tool observed in previous nanometric cutting experiment.

KW - Diamond cutting

KW - Focused ion beam

KW - Irradiation damage

KW - Nanometric cutting

KW - Tool wear

UR - http://www.scopus.com/inward/record.url?scp=84984645378&partnerID=8YFLogxK

UR - http://www.euspen.eu/events/16th-international-conference-exhibition/

M3 - Conference contribution

BT - Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016

PB - euspen

ER -

Tong Z, Jiang X, Bai Q, Blunt L, Luo X. Atomistic investigation of the wear of nanoscale diamond cutting tools shaped by focused ion beam. In Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016. euspen. 2016