Bayesian Segmentation and Clustering for Determining Cloud Mask Images

D. Barreto; F. Murtagh; J. Marcello

doi:10.1117/12.463768

Bayesian Segmentation and Clustering for Determining Cloud Mask Images

D. Barreto, F. Murtagh, J. Marcello

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Citations (Scopus)

Abstract

We assess both marginal density clustering, and spatial clustering using a Markov random field, on multiband Earth observation data. We use a Bayes factor assessment procedure in all cases. We find that the spatial model leads to better results, although the non-spatial clustering achieves a better false alarm rate.

Original language	English
Title of host publication	Opto-Ireland 2002
Subtitle of host publication	Optical Metrology, Imaging, and Machine Vision
Editors	Andrew Shearer, Fionn D. Murtagh, James Mahon, Paul F. Whelan
Publisher	SPIE
Pages	144-155
Number of pages	12
Volume	4877
ISBN (Print)	0819446580, 9780819446589
DOIs	https://doi.org/10.1117/12.463768
Publication status	Published - 19 Mar 2003
Externally published	Yes
Event	Opto-Ireland 2002: Optical metrology, Imaging, and Machine Vision - Galway, Ireland Duration: 5 Sept 2002 → 6 Sept 2002 https://www.researchgate.net/publication/260899755_Opto-Ireland_2002_Optical_Metrology_Imaging_and_Machine_Vision

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Publisher	SPIE
Volume	4877
ISSN (Print)	0277-786X

Conference

Conference	Opto-Ireland 2002: Optical metrology, Imaging, and Machine Vision
Country/Territory	Ireland
City	Galway
Period	5/09/02 → 6/09/02
Internet address	https://www.researchgate.net/publication/260899755_Opto-Ireland_2002_Optical_Metrology_Imaging_and_Machine_Vision

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Cite this

Barreto, D., Murtagh, F., & Marcello, J. (2003). Bayesian Segmentation and Clustering for Determining Cloud Mask Images. In A. Shearer, F. D. Murtagh, J. Mahon, & P. F. Whelan (Eds.), Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision (Vol. 4877, pp. 144-155). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 4877). SPIE. https://doi.org/10.1117/12.463768

@inproceedings{898e86aa4dfd473aa851c0e47f4dc2cc,

title = "Bayesian Segmentation and Clustering for Determining Cloud Mask Images",

abstract = "We assess both marginal density clustering, and spatial clustering using a Markov random field, on multiband Earth observation data. We use a Bayes factor assessment procedure in all cases. We find that the spatial model leads to better results, although the non-spatial clustering achieves a better false alarm rate.",

keywords = "Bayes factor, BIC, Earth observation, Gaussian mixture model, Karhunen-Lo{\`e}ve transform, Markov model, Multiband image, PLIC, Principal components analysis, Segmentation, Expectation maximization algorithms, Clouds, Image segmentation, Data modeling, Quantization, Lanthanum, Satellites, Visualization, Computer science",

author = "D. Barreto and F. Murtagh and J. Marcello",

year = "2003",

month = mar,

day = "19",

doi = "10.1117/12.463768",

language = "English",

isbn = "0819446580",

volume = "4877",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

pages = "144--155",

editor = "Andrew Shearer and Murtagh, \{Fionn D.\} and James Mahon and Whelan, \{Paul F.\}",

booktitle = "Opto-Ireland 2002",

address = "United States",

note = "Opto-Ireland 2002: Optical metrology, Imaging, and Machine Vision ; Conference date: 05-09-2002 Through 06-09-2002",

url = "https://www.researchgate.net/publication/260899755\_Opto-Ireland\_2002\_Optical\_Metrology\_Imaging\_and\_Machine\_Vision",

}

Barreto, D, Murtagh, F & Marcello, J 2003, Bayesian Segmentation and Clustering for Determining Cloud Mask Images. in A Shearer, FD Murtagh, J Mahon & PF Whelan (eds), Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision. vol. 4877, Proceedings of SPIE - The International Society for Optical Engineering, vol. 4877, SPIE, pp. 144-155, Opto-Ireland 2002: Optical metrology, Imaging, and Machine Vision, Galway, Ireland, 5/09/02. https://doi.org/10.1117/12.463768

Bayesian Segmentation and Clustering for Determining Cloud Mask Images. / Barreto, D.; Murtagh, F.; Marcello, J.
Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision. ed. / Andrew Shearer; Fionn D. Murtagh; James Mahon; Paul F. Whelan. Vol. 4877 SPIE, 2003. p. 144-155 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 4877).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Bayesian Segmentation and Clustering for Determining Cloud Mask Images

AU - Barreto, D.

AU - Murtagh, F.

AU - Marcello, J.

PY - 2003/3/19

Y1 - 2003/3/19

N2 - We assess both marginal density clustering, and spatial clustering using a Markov random field, on multiband Earth observation data. We use a Bayes factor assessment procedure in all cases. We find that the spatial model leads to better results, although the non-spatial clustering achieves a better false alarm rate.

AB - We assess both marginal density clustering, and spatial clustering using a Markov random field, on multiband Earth observation data. We use a Bayes factor assessment procedure in all cases. We find that the spatial model leads to better results, although the non-spatial clustering achieves a better false alarm rate.

KW - Bayes factor

KW - BIC

KW - Earth observation

KW - Gaussian mixture model

KW - Karhunen-Loève transform

KW - Markov model

KW - Multiband image

KW - PLIC

KW - Principal components analysis

KW - Segmentation

KW - Expectation maximization algorithms

KW - Clouds

KW - Image segmentation

KW - Data modeling

KW - Quantization

KW - Lanthanum

KW - Satellites

KW - Visualization

KW - Computer science

UR - https://www.scopus.com/pages/publications/0041731729

U2 - 10.1117/12.463768

DO - 10.1117/12.463768

M3 - Conference contribution

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SN - 0819446580

SN - 9780819446589

VL - 4877

T3 - Proceedings of SPIE - The International Society for Optical Engineering

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EP - 155

BT - Opto-Ireland 2002

A2 - Shearer, Andrew

A2 - Murtagh, Fionn D.

A2 - Mahon, James

A2 - Whelan, Paul F.

PB - SPIE

T2 - Opto-Ireland 2002: Optical metrology, Imaging, and Machine Vision

Y2 - 5 September 2002 through 6 September 2002

ER -

Bayesian Segmentation and Clustering for Determining Cloud Mask Images

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