Bit Error Rate Comparison for Radio Frequency Interconnection Based on BPSK, PAM and QAM Modulation

Ngu War Hlaing, Ali Farzamnia

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


The advancement of Ultra Large-Scale Integration (ULSI) technology has motivated the need to find an alternative solution such as wireless communication and on-chip Radio Frequency (RF), a popular method to substitute the hardwired metal interconnect that has reached its performance limit due to material limitations. Single-input-single-output schemes such as Binary Pulse Shift Keying (BPSK) modulation, Phase Amplitude Modulation (PAM), and Quadrature Amplitude Modulation (QAM) implemented with the RF interconnect has increased its advantages. However, the type of channel used is still unclear. Thus, this paper evaluated the Bit Error Rate (BER) of these three modulation types under Additive White Gaussian Noise (AWGN) and Rayleigh multipath fading channels. The findings indicate that BPSK delivers the highest BER performance on the AWGN channel, while 8-Ary PAM and 64-Ary QAM output attain the best BER on the Rayleigh channels, irrespective of its signal-To-noise proportion (SNR). Comparing AWGN and Rayleigh channels shows that AWGN offers the highest BER performance regardless of the modulation techniques and SNR. Thus, BPSK achieves better BER performance in the AWGN channel.

Original languageEnglish
Title of host publication19th IEEE Student Conference on Research and Development
Subtitle of host publicationSustainable Engineering and Technology towards Industry Revolution, SCOReD 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages5
ISBN (Electronic)9781665401937
ISBN (Print)9781665401944
Publication statusPublished - 29 Dec 2021
Externally publishedYes
Event19th IEEE Student Conference on Research and Development - Kota Kinabalu, Malaysia
Duration: 23 Nov 202125 Nov 2021
Conference number: 19

Publication series

NameIEEE Student Conference on Research and Development
ISSN (Print)2643-2439
ISSN (Electronic)2643-2447


Conference19th IEEE Student Conference on Research and Development
Abbreviated titleSCOReD 2021
CityKota Kinabalu

Cite this